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Analysing the capacitance–voltage measurements of vertical wrapped-gated nanowires

Karlström, Olov LU ; Wacker, Andreas LU orcid ; Storm, Kristian LU ; Astromskas, Gvidas LU ; Roddaro, Stefano LU ; Samuelson, Lars LU and Wernersson, Lars-Erik LU (2008) In Nanotechnology 19(43).
Abstract
The capacitance of arrays of vertical wrapped-gate InAs nanowires is analysed. With the help of a Poisson–Schrödinger solver, information about the doping density can be obtained directly. Further features in the measured capacitance–voltage characteristics can be attributed to the presence of surface states as well as the coexistence of electrons and holes in the wire. For both scenarios, quantitative estimates are provided. It is furthermore shown that the difference between the actual capacitance and the geometrical limit is quite large, and depends strongly on the nanowire material.
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author
; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Nanotechnology
volume
19
issue
43
article number
435201
publisher
IOP Publishing
external identifiers
  • wos:000259486700003
  • scopus:56349099360
  • pmid:21832684
ISSN
0957-4484
DOI
10.1088/0957-4484/19/43/435201
language
English
LU publication?
yes
id
b23dccb7-5a36-40b1-9c62-8dda0c73446a (old id 1241526)
date added to LUP
2016-04-04 08:09:36
date last changed
2022-01-29 03:05:17
@article{b23dccb7-5a36-40b1-9c62-8dda0c73446a,
  abstract     = {{The capacitance of arrays of vertical wrapped-gate InAs nanowires is analysed. With the help of a Poisson–Schrödinger solver, information about the doping density can be obtained directly. Further features in the measured capacitance–voltage characteristics can be attributed to the presence of surface states as well as the coexistence of electrons and holes in the wire. For both scenarios, quantitative estimates are provided. It is furthermore shown that the difference between the actual capacitance and the geometrical limit is quite large, and depends strongly on the nanowire material.}},
  author       = {{Karlström, Olov and Wacker, Andreas and Storm, Kristian and Astromskas, Gvidas and Roddaro, Stefano and Samuelson, Lars and Wernersson, Lars-Erik}},
  issn         = {{0957-4484}},
  language     = {{eng}},
  number       = {{43}},
  publisher    = {{IOP Publishing}},
  series       = {{Nanotechnology}},
  title        = {{Analysing the capacitance–voltage measurements of vertical wrapped-gated nanowires}},
  url          = {{http://dx.doi.org/10.1088/0957-4484/19/43/435201}},
  doi          = {{10.1088/0957-4484/19/43/435201}},
  volume       = {{19}},
  year         = {{2008}},
}