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- 2024
-
Mark
Source Design of Vertical III-V Nanowire Tunnel Field-Effect Transistors
Rangasamy, Gautham LU ; Zhu, Zhongyunshen LU
and Wernersson, Lars-Erik
LU
(2024)
In IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
10.
p.8-12
- Contribution to journal › Article
-
Mark
Cryogenic Ferroelectricity of HZO Capacitors on a III-V Semiconductor
- Contribution to journal › Article
-
Mark
TFET Circuit Configurations Operating below 60 mV/dec
Rangasamy, Gautham LU ; Zhu, Zhongyunshen LU
; Fhager, Lars Ohlsson
LU
and Wernersson, Lars Erik
LU
(2024)
In IEEE Transactions on Nanotechnology
23.
p.441-447
- Contribution to journal › Article
-
Mark
A Reconfigurable Ferroelectric Transistor as An Ultra-Scaled Cell for Low-Power In-Memory Data Processing
Zhu, Zhongyunshen LU
; Persson, Anton E.O.
LU
and Wernersson, Lars Erik
LU
(2024)
In Advanced Electronic Materials
- Contribution to journal › Article
-
Mark
RF Characterization of Ferroelectric MOS Capacitors
Persson, Anton E.O. LU
; Andric, Stefan
LU
; Fhager, Lars
LU
and Wernersson, Lars Erik
LU
(2024)
In IEEE Electron Device Letters
45(9).
p.1653-1656
- Contribution to journal › Article
-
Mark
Multifunctional Reconfigurable Operations in an Ultra-Scaled Ferroelectric Negative Transconductance Transistor
Zhu, Zhongyunshen LU
; Persson, Anton E.O.
LU
and Wernersson, Lars Erik
LU
(2024)
In ACS Nano
18(42).
p.28977-28985
- Contribution to journal › Article
- 2023
-
Mark
Sensing single domains and individual defects in scaled ferroelectrics
Zhu, Zhongyunshen LU
; Persson, Anton E O
LU
and Wernersson, Lars-Erik
LU
(2023)
In Science Advances
9(5).
- Contribution to journal › Article
-
Mark
Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors
Mamidala, Saketh Ram LU
; Svensson, Johannes
LU
and Wernersson, Lars-Erik
LU
(2023)
In ACS Applied Materials and Interfaces
15(15).
- Contribution to journal › Article
-
Mark
Reconfigurable signal modulation in a ferroelectric tunnel field-effect transistor
Zhu, Zhongyunshen LU
; Persson, Anton E. O.
LU
and Wernersson, Lars-Erik
LU
(2023)
In Nature Communications
14.
- Contribution to journal › Article
-
Mark
Electrically active defects in Al2O3-InGaAs MOS stacks at cryogenic temperatures
(2023) 2023 IEEE International Integrated Reliability Workshop, IIRW 2023 In IEEE International Integrated Reliability Workshop Final Report
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding