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- 2026
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Mark
Cryogenic NDRO in Conventional Non-Interface-Engineered HZO-Based MFM Capacitors
- Contribution to journal › Article
- 2025
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Mark
Interface Characterization of Plasma-Treated InAs Electrodes for Resistive Random-Access Memories Using Capacitance–Voltage Methods
- Contribution to journal › Article
- 2023
-
Mark
High-k/InGaAs interface defects at cryogenic temperature
- Contribution to journal › Article
- 2022
-
Mark
As-deposited ferroelectric HZO on a III–V semiconductor
- Contribution to journal › Article
