High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
Dubois, Tobias ; Azimane, Mohamed ; Larsson, Erik LU
; Marinissen, Erik Jan
; Wielage, Paul
and Wouters, Clemens
(2006)
14th Philips Research IC Test Seminar
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341038
- author
- Dubois, Tobias
; Azimane, Mohamed
; Larsson, Erik
LU
; Marinissen, Erik Jan
; Wielage, Paul
and Wouters, Clemens
- publishing date
- 2006
- type
- Contribution to conference
- publication status
- published
- subject
- keywords
- testing, design for testability, embedded systems, FIFO
- conference name
- 14th Philips Research IC Test Seminar
- conference dates
- 0001-01-02
- language
- English
- LU publication?
- no
- id
- 44738322-1ea4-48c0-a1b2-787824e6e3f1 (old id 2341038)
- date added to LUP
- 2016-04-04 13:35:18
- date last changed
- 2018-11-21 21:14:58
@misc{44738322-1ea4-48c0-a1b2-787824e6e3f1,
author = {{Dubois, Tobias and Azimane, Mohamed and Larsson, Erik and Marinissen, Erik Jan and Wielage, Paul and Wouters, Clemens}},
keywords = {{testing; design for testability; embedded systems; FIFO}},
language = {{eng}},
title = {{High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO}},
year = {{2006}},
}