System-on-Chip Test Scheduling based on Defect Probability
Larsson, Erik LU
; Pouget, Julien
and Peng, Zebo
(2003)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341094
- author
- Larsson, Erik
LU
; Pouget, Julien
and Peng, Zebo
- organization
- publishing date
- 2003
- type
- Other contribution
- publication status
- published
- subject
- keywords
- system-on-chip, testing, test scheduling, defect detection
- categories
- Popular Science
- language
- English
- LU publication?
- no
- id
- d5b53448-3947-40f6-9e79-6f8ca7f9d355 (old id 2341094)
- date added to LUP
- 2016-04-04 13:56:35
- date last changed
- 2018-11-21 21:17:19
@misc{d5b53448-3947-40f6-9e79-6f8ca7f9d355,
author = {{Larsson, Erik and Pouget, Julien and Peng, Zebo}},
keywords = {{system-on-chip; testing; test scheduling; defect detection}},
language = {{eng}},
title = {{System-on-Chip Test Scheduling based on Defect Probability}},
year = {{2003}},
}