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System-on-Chip Test Scheduling based on Defect Probability

Larsson, Erik LU ; Pouget, Julien and Peng, Zebo (2003)
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published
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keywords
system-on-chip, testing, test scheduling, defect detection
categories
Popular Science
language
English
LU publication?
no
id
d5b53448-3947-40f6-9e79-6f8ca7f9d355 (old id 2341094)
date added to LUP
2012-02-10 13:34:16
date last changed
2016-04-16 11:53:03
@misc{d5b53448-3947-40f6-9e79-6f8ca7f9d355,
  author       = {Larsson, Erik and Pouget, Julien and Peng, Zebo},
  keyword      = {system-on-chip,testing,test scheduling,defect detection},
  language     = {eng},
  title        = {System-on-Chip Test Scheduling based on Defect Probability},
  year         = {2003},
}