Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
(2007) Design, Automation, and Test in Europe DATE p.859-859- Abstract
- Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which... (More)
- Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which includes waitingperiods. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340992
- author
- Dubois, Tobias ; Marinissen, Erik Jan ; Azimane, Mohamed ; Wielage, Paul ; Larsson, Erik LU and Wouters, Clemens
- organization
- publishing date
- 2007
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- embedded systems, testing, FIFO, memory, test quality analysis
- host publication
- [Host publication title missing]
- pages
- 859 - 859
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- Design, Automation, and Test in Europe DATE
- conference location
- Nice, France
- conference dates
- 2007-04-16 - 2007-04-20
- external identifiers
-
- scopus:34548321156
- ISBN
- 978-3-9810801-2-4
- DOI
- 10.1109/DATE.2007.364400
- language
- English
- LU publication?
- no
- id
- f381309f-d705-447d-aa9e-07a14fa4f042 (old id 2340992)
- date added to LUP
- 2016-04-04 11:47:09
- date last changed
- 2022-01-29 22:25:45
@inproceedings{f381309f-d705-447d-aa9e-07a14fa4f042, abstract = {{Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which includes waitingperiods.}}, author = {{Dubois, Tobias and Marinissen, Erik Jan and Azimane, Mohamed and Wielage, Paul and Larsson, Erik and Wouters, Clemens}}, booktitle = {{[Host publication title missing]}}, isbn = {{978-3-9810801-2-4}}, keywords = {{embedded systems; testing; FIFO; memory; test quality analysis}}, language = {{eng}}, pages = {{859--859}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO}}, url = {{http://dx.doi.org/10.1109/DATE.2007.364400}}, doi = {{10.1109/DATE.2007.364400}}, year = {{2007}}, }