Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system
(2019) In Journal of Synchrotron Radiation 26(4). p.1173-1180- Abstract
The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence |μ| has been quantified as a function of the secondary source aperture (SSA); the coherence is larger than 50% for SSA sizes below 11 µm at hard X-ray energies of 14 keV. For an SSA size of 5 µm, the degree of coherence has been determined to be 87%.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/28420409-b6ee-48ec-869e-cb2689fb312a
- author
- Osterhoff, Markus ; Robisch, Anna Lena ; Soltau, Jakob ; Eckermann, Marina ; Kalbfleisch, Sebastian LU ; Carbone, Dina LU ; Johansson, Ulf LU and Salditt, Tim
- organization
- publishing date
- 2019-07
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- coherence, holography, nano-focus
- in
- Journal of Synchrotron Radiation
- volume
- 26
- issue
- 4
- pages
- 1173 - 1180
- publisher
- International Union of Crystallography
- external identifiers
-
- scopus:85067657088
- pmid:31274441
- ISSN
- 0909-0495
- DOI
- 10.1107/S1600577519003886
- language
- English
- LU publication?
- yes
- id
- 28420409-b6ee-48ec-869e-cb2689fb312a
- date added to LUP
- 2019-07-08 15:24:09
- date last changed
- 2024-08-07 02:27:26
@article{28420409-b6ee-48ec-869e-cb2689fb312a, abstract = {{<p>The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence |μ| has been quantified as a function of the secondary source aperture (SSA); the coherence is larger than 50% for SSA sizes below 11 µm at hard X-ray energies of 14 keV. For an SSA size of 5 µm, the degree of coherence has been determined to be 87%.</p>}}, author = {{Osterhoff, Markus and Robisch, Anna Lena and Soltau, Jakob and Eckermann, Marina and Kalbfleisch, Sebastian and Carbone, Dina and Johansson, Ulf and Salditt, Tim}}, issn = {{0909-0495}}, keywords = {{coherence; holography; nano-focus}}, language = {{eng}}, number = {{4}}, pages = {{1173--1180}}, publisher = {{International Union of Crystallography}}, series = {{Journal of Synchrotron Radiation}}, title = {{Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system}}, url = {{http://dx.doi.org/10.1107/S1600577519003886}}, doi = {{10.1107/S1600577519003886}}, volume = {{26}}, year = {{2019}}, }