Counting dislocations in microcrystals by coherent X-Ray diffraction
(2013) In Physical Review Letters 111(6).- Abstract
We present here an unprecedented way of quantifying the number of dislocations in microcrystals. This method relies on a combination of several state-of-the-art techniques: coherent x-ray diffraction used as a local probe, together with the controlled compression of micro-objects. We demonstrate that by using this method, dislocations in the microcrystal can be detected and their number precisely quantified. This cannot be done with other techniques in a nondestructive way. Our method opens a route for the study of many small-scale systems with defect-dependent physical properties and it could become a critical tool for addressing future challenges in nanotechnology.
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https://lup.lub.lu.se/record/2a3dd379-b3d2-4657-907f-977593991c53
- author
- Jacques, V. L.R. ; Carbone, D. LU ; Ghisleni, R. and Thilly, L.
- publishing date
- 2013-08-07
- type
- Contribution to journal
- publication status
- published
- in
- Physical Review Letters
- volume
- 111
- issue
- 6
- article number
- 065503
- publisher
- American Physical Society
- external identifiers
-
- scopus:84881514207
- ISSN
- 0031-9007
- DOI
- 10.1103/PhysRevLett.111.065503
- language
- English
- LU publication?
- no
- id
- 2a3dd379-b3d2-4657-907f-977593991c53
- date added to LUP
- 2021-12-15 11:46:35
- date last changed
- 2022-03-27 00:02:14
@article{2a3dd379-b3d2-4657-907f-977593991c53, abstract = {{<p>We present here an unprecedented way of quantifying the number of dislocations in microcrystals. This method relies on a combination of several state-of-the-art techniques: coherent x-ray diffraction used as a local probe, together with the controlled compression of micro-objects. We demonstrate that by using this method, dislocations in the microcrystal can be detected and their number precisely quantified. This cannot be done with other techniques in a nondestructive way. Our method opens a route for the study of many small-scale systems with defect-dependent physical properties and it could become a critical tool for addressing future challenges in nanotechnology.</p>}}, author = {{Jacques, V. L.R. and Carbone, D. and Ghisleni, R. and Thilly, L.}}, issn = {{0031-9007}}, language = {{eng}}, month = {{08}}, number = {{6}}, publisher = {{American Physical Society}}, series = {{Physical Review Letters}}, title = {{Counting dislocations in microcrystals by coherent X-Ray diffraction}}, url = {{http://dx.doi.org/10.1103/PhysRevLett.111.065503}}, doi = {{10.1103/PhysRevLett.111.065503}}, volume = {{111}}, year = {{2013}}, }