Growth and structural characterization of single-crystal (001) oriented Mo V superlattices
(1990) In Vacuum 41(4-6). p.1231-1233- Abstract
- Dual target magnetron sputtering has been used to grow single-crysal MoV superlattice structures (SLS) with modulation wavelengths λ ranging from 0.6 to 17.7 nm on (001) oriented MgO substrates held at temperatures Ts between 600 and 900°C. High resolution cross-sectional transmission electron microscopy (HRXTEM) images and comparisions between experimental and calculated X-ray diffraction (XRD) spectra show that SLS with an interface sharpness of ±1 monolayer (±0.15 nm) could be grown for λ ⩽ 4.9 nm and Ts ⩽ 700°C whereas interdiffusion broadened the interfaces for higher Ts values. This interface sharpness was also verified by growing SLS with λ = 0.6 nm (one unit cell of Mo and one of V) which exhibited strong superlattice satellites... (More)
- Dual target magnetron sputtering has been used to grow single-crysal MoV superlattice structures (SLS) with modulation wavelengths λ ranging from 0.6 to 17.7 nm on (001) oriented MgO substrates held at temperatures Ts between 600 and 900°C. High resolution cross-sectional transmission electron microscopy (HRXTEM) images and comparisions between experimental and calculated X-ray diffraction (XRD) spectra show that SLS with an interface sharpness of ±1 monolayer (±0.15 nm) could be grown for λ ⩽ 4.9 nm and Ts ⩽ 700°C whereas interdiffusion broadened the interfaces for higher Ts values. This interface sharpness was also verified by growing SLS with λ = 0.6 nm (one unit cell of Mo and one of V) which exhibited strong superlattice satellites in both XRD and selected area electron diffraction (SAED), and contrast from the individual layers was also observed in HRXTEM images. For λ > 4.9 nm, HRXTEM images showed non-uniform layers and the XRD peak width (FWHM) increased by 250%. (Less)
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- author
- Birch, J. ; Yamamoto, Y. ; Hultman, L. ; Radnoczi, G. and Wallenberg, Lars Reine LU
- organization
- publishing date
- 1990
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Vacuum
- volume
- 41
- issue
- 4-6
- pages
- 3 pages
- publisher
- Elsevier
- external identifiers
-
- scopus:0025550358
- ISSN
- 0042-207X
- DOI
- 10.1016/0042-207X(90)93919-A
- language
- English
- LU publication?
- yes
- id
- 72dcddd6-aeb0-4e30-a1a0-2cb1cbaca0f0
- date added to LUP
- 2023-10-31 14:48:50
- date last changed
- 2023-12-27 04:01:08
@article{72dcddd6-aeb0-4e30-a1a0-2cb1cbaca0f0, abstract = {{Dual target magnetron sputtering has been used to grow single-crysal MoV superlattice structures (SLS) with modulation wavelengths λ ranging from 0.6 to 17.7 nm on (001) oriented MgO substrates held at temperatures Ts between 600 and 900°C. High resolution cross-sectional transmission electron microscopy (HRXTEM) images and comparisions between experimental and calculated X-ray diffraction (XRD) spectra show that SLS with an interface sharpness of ±1 monolayer (±0.15 nm) could be grown for λ ⩽ 4.9 nm and Ts ⩽ 700°C whereas interdiffusion broadened the interfaces for higher Ts values. This interface sharpness was also verified by growing SLS with λ = 0.6 nm (one unit cell of Mo and one of V) which exhibited strong superlattice satellites in both XRD and selected area electron diffraction (SAED), and contrast from the individual layers was also observed in HRXTEM images. For λ > 4.9 nm, HRXTEM images showed non-uniform layers and the XRD peak width (FWHM) increased by 250%.}}, author = {{Birch, J. and Yamamoto, Y. and Hultman, L. and Radnoczi, G. and Wallenberg, Lars Reine}}, issn = {{0042-207X}}, language = {{eng}}, number = {{4-6}}, pages = {{1231--1233}}, publisher = {{Elsevier}}, series = {{Vacuum}}, title = {{Growth and structural characterization of single-crystal (001) oriented Mo V superlattices}}, url = {{http://dx.doi.org/10.1016/0042-207X(90)93919-A}}, doi = {{10.1016/0042-207X(90)93919-A}}, volume = {{41}}, year = {{1990}}, }