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Growth and structural characterization of single-crystal (001) oriented Mo V superlattices

Birch, J. ; Yamamoto, Y. ; Hultman, L. ; Radnoczi, G. and Wallenberg, Lars Reine LU (1990) In Vacuum 41(4-6). p.1231-1233
Abstract
Dual target magnetron sputtering has been used to grow single-crysal MoV superlattice structures (SLS) with modulation wavelengths λ ranging from 0.6 to 17.7 nm on (001) oriented MgO substrates held at temperatures Ts between 600 and 900°C. High resolution cross-sectional transmission electron microscopy (HRXTEM) images and comparisions between experimental and calculated X-ray diffraction (XRD) spectra show that SLS with an interface sharpness of ±1 monolayer (±0.15 nm) could be grown for λ ⩽ 4.9 nm and Ts ⩽ 700°C whereas interdiffusion broadened the interfaces for higher Ts values. This interface sharpness was also verified by growing SLS with λ = 0.6 nm (one unit cell of Mo and one of V) which exhibited strong superlattice satellites... (More)
Dual target magnetron sputtering has been used to grow single-crysal MoV superlattice structures (SLS) with modulation wavelengths λ ranging from 0.6 to 17.7 nm on (001) oriented MgO substrates held at temperatures Ts between 600 and 900°C. High resolution cross-sectional transmission electron microscopy (HRXTEM) images and comparisions between experimental and calculated X-ray diffraction (XRD) spectra show that SLS with an interface sharpness of ±1 monolayer (±0.15 nm) could be grown for λ ⩽ 4.9 nm and Ts ⩽ 700°C whereas interdiffusion broadened the interfaces for higher Ts values. This interface sharpness was also verified by growing SLS with λ = 0.6 nm (one unit cell of Mo and one of V) which exhibited strong superlattice satellites in both XRD and selected area electron diffraction (SAED), and contrast from the individual layers was also observed in HRXTEM images. For λ > 4.9 nm, HRXTEM images showed non-uniform layers and the XRD peak width (FWHM) increased by 250%. (Less)
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author
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organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Vacuum
volume
41
issue
4-6
pages
3 pages
publisher
Elsevier
external identifiers
  • scopus:0025550358
ISSN
0042-207X
DOI
10.1016/0042-207X(90)93919-A
language
English
LU publication?
yes
id
72dcddd6-aeb0-4e30-a1a0-2cb1cbaca0f0
date added to LUP
2023-10-31 14:48:50
date last changed
2023-12-27 04:01:08
@article{72dcddd6-aeb0-4e30-a1a0-2cb1cbaca0f0,
  abstract     = {{Dual target magnetron sputtering has been used to grow single-crysal MoV superlattice structures (SLS) with modulation wavelengths λ ranging from 0.6 to 17.7 nm on (001) oriented MgO substrates held at temperatures Ts between 600 and 900°C. High resolution cross-sectional transmission electron microscopy (HRXTEM) images and comparisions between experimental and calculated X-ray diffraction (XRD) spectra show that SLS with an interface sharpness of ±1 monolayer (±0.15 nm) could be grown for λ ⩽ 4.9 nm and Ts ⩽ 700°C whereas interdiffusion broadened the interfaces for higher Ts values. This interface sharpness was also verified by growing SLS with λ = 0.6 nm (one unit cell of Mo and one of V) which exhibited strong superlattice satellites in both XRD and selected area electron diffraction (SAED), and contrast from the individual layers was also observed in HRXTEM images. For λ > 4.9 nm, HRXTEM images showed non-uniform layers and the XRD peak width (FWHM) increased by 250%.}},
  author       = {{Birch, J. and Yamamoto, Y. and Hultman, L. and Radnoczi, G. and Wallenberg, Lars Reine}},
  issn         = {{0042-207X}},
  language     = {{eng}},
  number       = {{4-6}},
  pages        = {{1231--1233}},
  publisher    = {{Elsevier}},
  series       = {{Vacuum}},
  title        = {{Growth and structural characterization of single-crystal (001) oriented Mo V superlattices}},
  url          = {{http://dx.doi.org/10.1016/0042-207X(90)93919-A}},
  doi          = {{10.1016/0042-207X(90)93919-A}},
  volume       = {{41}},
  year         = {{1990}},
}