Specification of a Specimen for Accelerated Thermal Aging Tests
(2019) 12th IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019 p.49-55- Abstract
This document presents design considerations of a sample for accelerated thermal aging tests. The proposed specimen is a parallel wired solenoid that is evaluated by using an axi-symmetric 2D finite element (FE) model in Comsol multi-physics. The aim of the design model is visualizing an interior stress distribution of an idealized coil in order to interpret the physics-of-failure in a more complex system than twisted pairs of enameled wires. Design-for-manufacture and design-for-testability aspects are considered when developing the reference FE model. Fault development is the main concern when analyzing electric field distribution across electric insulation system (EIS), and the related mechanical and thermal stresses under thermal... (More)
This document presents design considerations of a sample for accelerated thermal aging tests. The proposed specimen is a parallel wired solenoid that is evaluated by using an axi-symmetric 2D finite element (FE) model in Comsol multi-physics. The aim of the design model is visualizing an interior stress distribution of an idealized coil in order to interpret the physics-of-failure in a more complex system than twisted pairs of enameled wires. Design-for-manufacture and design-for-testability aspects are considered when developing the reference FE model. Fault development is the main concern when analyzing electric field distribution across electric insulation system (EIS), and the related mechanical and thermal stresses under thermal loading conditions from deterioration of EIS to inter-turn short-circuit. The significance of this theoretical kind of preparatory study is to design a test that can facilitate recognition of a fault development and identification of related diagnostic indicators.
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- author
- Reinap, Avo LU and Upadhyay, Akanksha LU
- organization
- publishing date
- 2019-10-14
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- Accelerated Aging, Design for Experiments, Electric, Finite Element Method, Manufacture and Testability, Mechanic and Thermal Stresses, Numeric Field Computation, Physics of Failure, Test Object for Insulation Testing
- host publication
- Proceedings of the 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019
- article number
- 8864856
- pages
- 7 pages
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- 12th IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019
- conference location
- Toulouse, France
- conference dates
- 2019-08-27 - 2019-08-30
- external identifiers
-
- scopus:85074277039
- ISBN
- 9781728118321
- DOI
- 10.1109/DEMPED.2019.8864856
- language
- English
- LU publication?
- yes
- id
- 930abbe9-c686-4e36-8abd-4b95dbb5d6b6
- date added to LUP
- 2019-11-21 14:19:44
- date last changed
- 2022-04-18 19:12:23
@inproceedings{930abbe9-c686-4e36-8abd-4b95dbb5d6b6, abstract = {{<p>This document presents design considerations of a sample for accelerated thermal aging tests. The proposed specimen is a parallel wired solenoid that is evaluated by using an axi-symmetric 2D finite element (FE) model in Comsol multi-physics. The aim of the design model is visualizing an interior stress distribution of an idealized coil in order to interpret the physics-of-failure in a more complex system than twisted pairs of enameled wires. Design-for-manufacture and design-for-testability aspects are considered when developing the reference FE model. Fault development is the main concern when analyzing electric field distribution across electric insulation system (EIS), and the related mechanical and thermal stresses under thermal loading conditions from deterioration of EIS to inter-turn short-circuit. The significance of this theoretical kind of preparatory study is to design a test that can facilitate recognition of a fault development and identification of related diagnostic indicators.</p>}}, author = {{Reinap, Avo and Upadhyay, Akanksha}}, booktitle = {{Proceedings of the 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019}}, isbn = {{9781728118321}}, keywords = {{Accelerated Aging; Design for Experiments; Electric; Finite Element Method; Manufacture and Testability; Mechanic and Thermal Stresses; Numeric Field Computation; Physics of Failure; Test Object for Insulation Testing}}, language = {{eng}}, month = {{10}}, pages = {{49--55}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Specification of a Specimen for Accelerated Thermal Aging Tests}}, url = {{http://dx.doi.org/10.1109/DEMPED.2019.8864856}}, doi = {{10.1109/DEMPED.2019.8864856}}, year = {{2019}}, }