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Low-temperature nanoscale heat transport in a gadolinium iron garnet heterostructure probed by ultrafast x-ray diffraction

Sri Gyan, Deepankar ; Mannix, Danny LU ; Carbone, Dina LU ; Sumpter, James L. ; Geprägs, Stephan ; Dietlein, Maxim ; Gross, Rudolf ; Jurgilaitis, Andrius LU ; Pham, Van Thai LU and Coudert-Alteirac, Hélène LU , et al. (2022) In Structural Dynamics 9(4).
Abstract

Time-resolved x-ray diffraction has been used to measure the low-temperature thermal transport properties of a Pt/Gd3Fe5O12//Gd3Ga5O12 metal/oxide heterostructure relevant to applications in spin caloritronics. A pulsed femtosecond optical signal produces a rapid temperature rise in the Pt layer, followed by heat transport into the Gd3Fe5O12 (GdIG) thin film and the Gd3Ga5O12 (GGG) substrate. The time dependence of x-ray diffraction from the GdIG layer was tracked using an accelerator-based femtosecond x-ray source. The ultrafast diffraction measurements probed the intensity of the GdIG (1 -1 2) x-ray reflection in a grazing-incidence x-ray diffraction geometry. The comparison of the variation of the diffracted x-ray intensity with a... (More)

Time-resolved x-ray diffraction has been used to measure the low-temperature thermal transport properties of a Pt/Gd3Fe5O12//Gd3Ga5O12 metal/oxide heterostructure relevant to applications in spin caloritronics. A pulsed femtosecond optical signal produces a rapid temperature rise in the Pt layer, followed by heat transport into the Gd3Fe5O12 (GdIG) thin film and the Gd3Ga5O12 (GGG) substrate. The time dependence of x-ray diffraction from the GdIG layer was tracked using an accelerator-based femtosecond x-ray source. The ultrafast diffraction measurements probed the intensity of the GdIG (1 -1 2) x-ray reflection in a grazing-incidence x-ray diffraction geometry. The comparison of the variation of the diffracted x-ray intensity with a model including heat transport and the temperature dependence of the GdIG lattice parameter allows the thermal conductance of the Pt/GdIG and GdIG//GGG interfaces to be determined. Complementary synchrotron x-ray diffraction studies of the low-temperature thermal expansion properties of the GdIG layer provide a precise calibration of the temperature dependence of the GdIG lattice parameter. The interfacial thermal conductance of the Pt/GdIG and GdIG//GGG interfaces determined from the time-resolved diffraction study is of the same order of magnitude as previous reports for metal/oxide and epitaxial dielectric interfaces. The thermal parameters of the Pt/GdIG//GGG heterostructure will aid in the design and implementation of thermal transport devices and nanostructures.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Structural Dynamics
volume
9
issue
4
article number
045101
publisher
American Institute of Physics (AIP)
external identifiers
  • scopus:85135319853
  • pmid:35909634
ISSN
2329-7778
DOI
10.1063/4.0000154
language
English
LU publication?
yes
additional info
Publisher Copyright: © 2022 Author(s).
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adce649c-89c4-41cd-bf7d-34e16609c865
date added to LUP
2022-08-14 21:27:21
date last changed
2024-06-27 19:35:22
@article{adce649c-89c4-41cd-bf7d-34e16609c865,
  abstract     = {{<p>Time-resolved x-ray diffraction has been used to measure the low-temperature thermal transport properties of a Pt/Gd3Fe5O12//Gd3Ga5O12 metal/oxide heterostructure relevant to applications in spin caloritronics. A pulsed femtosecond optical signal produces a rapid temperature rise in the Pt layer, followed by heat transport into the Gd3Fe5O12 (GdIG) thin film and the Gd3Ga5O12 (GGG) substrate. The time dependence of x-ray diffraction from the GdIG layer was tracked using an accelerator-based femtosecond x-ray source. The ultrafast diffraction measurements probed the intensity of the GdIG (1 -1 2) x-ray reflection in a grazing-incidence x-ray diffraction geometry. The comparison of the variation of the diffracted x-ray intensity with a model including heat transport and the temperature dependence of the GdIG lattice parameter allows the thermal conductance of the Pt/GdIG and GdIG//GGG interfaces to be determined. Complementary synchrotron x-ray diffraction studies of the low-temperature thermal expansion properties of the GdIG layer provide a precise calibration of the temperature dependence of the GdIG lattice parameter. The interfacial thermal conductance of the Pt/GdIG and GdIG//GGG interfaces determined from the time-resolved diffraction study is of the same order of magnitude as previous reports for metal/oxide and epitaxial dielectric interfaces. The thermal parameters of the Pt/GdIG//GGG heterostructure will aid in the design and implementation of thermal transport devices and nanostructures.</p>}},
  author       = {{Sri Gyan, Deepankar and Mannix, Danny and Carbone, Dina and Sumpter, James L. and Geprägs, Stephan and Dietlein, Maxim and Gross, Rudolf and Jurgilaitis, Andrius and Pham, Van Thai and Coudert-Alteirac, Hélène and Larsson, Jörgen and Haskel, Daniel and Strempfer, Jörg and Evans, Paul G.}},
  issn         = {{2329-7778}},
  language     = {{eng}},
  month        = {{07}},
  number       = {{4}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Structural Dynamics}},
  title        = {{Low-temperature nanoscale heat transport in a gadolinium iron garnet heterostructure probed by ultrafast x-ray diffraction}},
  url          = {{http://dx.doi.org/10.1063/4.0000154}},
  doi          = {{10.1063/4.0000154}},
  volume       = {{9}},
  year         = {{2022}},
}