X-ray coherent diffraction imaging with an objective lens : Towards three-dimensional mapping of thick polycrystals
(2020) In Physical Review Research 2(3).- Abstract
We demonstrate an X-ray coherent imaging method that combines high spatial resolution with the ability to map grains within thick polycrystalline specimens. An X-ray objective serves to isolate an embedded grain. Iterative oversampling routines and Fourier synthesis are used to reconstruct the shape and strain field from the far-field intensity pattern. In a demonstration experiment a ∼500-nm Pt grain embedded in a polycrystalline Pt matrix is mapped in three dimensions without compromising the spatial resolution. No information on the pupil function of the lens is required and lens aberrations are not critical.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/d0d9afc1-1ee0-4334-9cad-a92c045a8d94
- author
- Pedersen, A. F. ; Chamard, V. ; Detlefs, C. ; Zhou, T. ; Carbone, D. LU and Poulsen, H. F.
- organization
- publishing date
- 2020-07
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Physical Review Research
- volume
- 2
- issue
- 3
- article number
- 033031
- publisher
- American Physical Society
- external identifiers
-
- scopus:85091817167
- ISSN
- 2643-1564
- DOI
- 10.1103/PhysRevResearch.2.033031
- language
- English
- LU publication?
- yes
- additional info
- Publisher Copyright: © 2020 authors. Published by the American Physical Society. Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
- id
- d0d9afc1-1ee0-4334-9cad-a92c045a8d94
- date added to LUP
- 2021-12-15 11:58:07
- date last changed
- 2022-04-19 18:44:49
@article{d0d9afc1-1ee0-4334-9cad-a92c045a8d94, abstract = {{<p>We demonstrate an X-ray coherent imaging method that combines high spatial resolution with the ability to map grains within thick polycrystalline specimens. An X-ray objective serves to isolate an embedded grain. Iterative oversampling routines and Fourier synthesis are used to reconstruct the shape and strain field from the far-field intensity pattern. In a demonstration experiment a ∼500-nm Pt grain embedded in a polycrystalline Pt matrix is mapped in three dimensions without compromising the spatial resolution. No information on the pupil function of the lens is required and lens aberrations are not critical.</p>}}, author = {{Pedersen, A. F. and Chamard, V. and Detlefs, C. and Zhou, T. and Carbone, D. and Poulsen, H. F.}}, issn = {{2643-1564}}, language = {{eng}}, number = {{3}}, publisher = {{American Physical Society}}, series = {{Physical Review Research}}, title = {{X-ray coherent diffraction imaging with an objective lens : Towards three-dimensional mapping of thick polycrystals}}, url = {{http://dx.doi.org/10.1103/PhysRevResearch.2.033031}}, doi = {{10.1103/PhysRevResearch.2.033031}}, volume = {{2}}, year = {{2020}}, }