Olof Persson (Former)
1 – 8 of 8
- show: 10
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=" "
width=" "
height=" "
allowtransparency="true"
frameborder="0">
</iframe>
- 2013
-
Mark
Interface characterization of metal-HfO2-InAs gate stacks using hard x-ray photoemission spectroscopy
(
- Contribution to journal › Article
-
Mark
Current−Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope
(
- Contribution to journal › Article
- 2012
-
Mark
Atomic Surface Structure and Electronic Properties of Semiconductor Nanowires Studied by Scanning Tunneling Microscopy and Spectroscopy
2012) ICPS 2012(
- Contribution to conference › Abstract