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Performance analysis of general charge sampling

Xu, Gang LU and Yuan, Jiren LU (2005) In IEEE Transactions on Circuits and Systems II: Express Briefs 52(2). p.107-111
Abstract
This brief focuses on the performance analysis of general charge-sampling circuits for signal capture. The theoretical analysis in the brief can be applied not only for weak signal capture, but also for the normal signal sampling. Based on a general charge-sampling model, the transfer function, the noise performance, and the clock jitter tolerance are analyzed and compared to conventional voltage sampling. The results provide a theoretical basis for charge-sampling circuit design.
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author
and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
analog-digital conversion, analog circuits, charge sampling, jitter, sample-and-hold circuits, switched circuits, sampling methods, system, switched
in
IEEE Transactions on Circuits and Systems II: Express Briefs
volume
52
issue
2
pages
107 - 111
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
external identifiers
  • wos:000226942700011
  • scopus:14644393091
ISSN
1549-7747
DOI
10.1109/TCSII.2004.840479
language
English
LU publication?
yes
id
0948dfb5-266d-4f99-8480-c5a47199aa42 (old id 254485)
date added to LUP
2016-04-01 16:11:49
date last changed
2025-10-14 11:48:47
@article{0948dfb5-266d-4f99-8480-c5a47199aa42,
  abstract     = {{This brief focuses on the performance analysis of general charge-sampling circuits for signal capture. The theoretical analysis in the brief can be applied not only for weak signal capture, but also for the normal signal sampling. Based on a general charge-sampling model, the transfer function, the noise performance, and the clock jitter tolerance are analyzed and compared to conventional voltage sampling. The results provide a theoretical basis for charge-sampling circuit design.}},
  author       = {{Xu, Gang and Yuan, Jiren}},
  issn         = {{1549-7747}},
  keywords     = {{analog-digital conversion; analog circuits; charge sampling; jitter; sample-and-hold circuits; switched circuits; sampling methods; system; switched}},
  language     = {{eng}},
  number       = {{2}},
  pages        = {{107--111}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  series       = {{IEEE Transactions on Circuits and Systems II: Express Briefs}},
  title        = {{Performance analysis of general charge sampling}},
  url          = {{http://dx.doi.org/10.1109/TCSII.2004.840479}},
  doi          = {{10.1109/TCSII.2004.840479}},
  volume       = {{52}},
  year         = {{2005}},
}