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Special Issue On "Advanced Control Methods For Scanning Probe Microscopy"

Schitter, Georg and Åström, Karl Johan LU (2009) In Asian Journal of Control 11(2). p.101-103
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Asian Journal of Control
volume
11
issue
2
pages
101 - 103
publisher
Chinese Automatic Control Society
external identifiers
  • wos:000265717500001
ISSN
1934-6093
DOI
10.1002/asjc.086
language
English
LU publication?
yes
id
d1f35e97-edaf-4923-aed3-fc34d03c54fe (old id 1428119)
date added to LUP
2009-06-25 10:40:16
date last changed
2016-04-15 19:42:35
@misc{d1f35e97-edaf-4923-aed3-fc34d03c54fe,
  author       = {Schitter, Georg and Åström, Karl Johan},
  issn         = {1934-6093},
  language     = {eng},
  number       = {2},
  pages        = {101--103},
  publisher    = {Chinese Automatic Control Society},
  series       = {Asian Journal of Control},
  title        = {Special Issue On "Advanced Control Methods For Scanning Probe Microscopy"},
  url          = {http://dx.doi.org/10.1002/asjc.086},
  volume       = {11},
  year         = {2009},
}