Special Issue On "Advanced Control Methods For Scanning Probe Microscopy"
(2009) In Asian Journal of Control 11(2). p.101-103
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1428119
- author
- Schitter, Georg and Åström, Karl Johan LU
- organization
- publishing date
- 2009
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Asian Journal of Control
- volume
- 11
- issue
- 2
- pages
- 101 - 103
- publisher
- Chinese Automatic Control Society
- external identifiers
-
- wos:000265717500001
- ISSN
- 1934-6093
- DOI
- 10.1002/asjc.086
- language
- English
- LU publication?
- yes
- id
- d1f35e97-edaf-4923-aed3-fc34d03c54fe (old id 1428119)
- date added to LUP
- 2016-04-01 12:05:49
- date last changed
- 2018-11-21 20:03:46
@misc{d1f35e97-edaf-4923-aed3-fc34d03c54fe,
author = {{Schitter, Georg and Åström, Karl Johan}},
issn = {{1934-6093}},
language = {{eng}},
number = {{2}},
pages = {{101--103}},
publisher = {{Chinese Automatic Control Society}},
series = {{Asian Journal of Control}},
title = {{Special Issue On "Advanced Control Methods For Scanning Probe Microscopy"}},
url = {{http://dx.doi.org/10.1002/asjc.086}},
doi = {{10.1002/asjc.086}},
volume = {{11}},
year = {{2009}},
}