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Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO

Dubois, Tobias; Marinissen, Erik Jan; Azimane, Mohamed; Wielage, Paul; Larsson, Erik LU and Wouters, Clemens (2007) Design, Automation, and Test in Europe DATE In [Host publication title missing] p.859-859
Abstract
Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which... (More)
Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which includes waitingperiods. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
embedded systems, testing, FIFO, memory, test quality analysis
in
[Host publication title missing]
pages
859 - 859
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
Design, Automation, and Test in Europe DATE
external identifiers
  • scopus:34548321156
ISBN
978-3-9810801-2-4
DOI
10.1109/DATE.2007.364400
language
English
LU publication?
no
id
f381309f-d705-447d-aa9e-07a14fa4f042 (old id 2340992)
date added to LUP
2012-02-10 13:41:28
date last changed
2017-01-01 08:05:18
@inproceedings{f381309f-d705-447d-aa9e-07a14fa4f042,
  abstract     = {Embedded First-InFirst-Out (FIFO) memories are increasingly used in many IC designs.We have created a new full-custom embedded FIFO module withasynchronous read and write clocks, which is at least a factor twosmaller and also faster than SRAM-based and standard-cell-basedcounterparts. The detection qualities of the FIFO test for bothhard and weak resistive shorts and opens have been analyzed by anIFA-like method based on analog simulation. The defect coverage ofthe initial FIFO test for shorts in the bit-cell matrix has beenimproved by inclusion of an additional data background andlow-voltage testing; for low-resistant shorts, 100% defect coverageis obtained. The defect coverage for opens has been improved by anew test procedure which includes waitingperiods.},
  author       = {Dubois, Tobias and Marinissen, Erik Jan and Azimane, Mohamed and Wielage, Paul and Larsson, Erik and Wouters, Clemens},
  booktitle    = {[Host publication title missing]},
  isbn         = {978-3-9810801-2-4},
  keyword      = {embedded systems,testing,FIFO,memory,test quality analysis},
  language     = {eng},
  pages        = {859--859},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO},
  url          = {http://dx.doi.org/10.1109/DATE.2007.364400},
  year         = {2007},
}