Abort-on-Fail Based Test Scheduling
(2005) In Journal of Electronic Testing 21(6). p.651-658- Abstract
- The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect... (More)
- The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect probabilitiesinto account. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341062
- author
- Larsson, Erik LU ; Pouget, Julien and Peng, Zebo
- publishing date
- 2005
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- testing, test scheduling, abort-on-fail
- in
- Journal of Electronic Testing
- volume
- 21
- issue
- 6
- pages
- 651 - 658
- publisher
- Springer
- external identifiers
-
- scopus:27844610759
- ISSN
- 0923-8174
- DOI
- 10.1007/s10836-005-4597-z
- language
- English
- LU publication?
- no
- id
- e8c59741-1ba6-4989-b350-ead226c27e16 (old id 2341062)
- date added to LUP
- 2016-04-04 08:20:59
- date last changed
- 2022-01-29 03:21:23
@article{e8c59741-1ba6-4989-b350-ead226c27e16, abstract = {{The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect probabilitiesinto account.}}, author = {{Larsson, Erik and Pouget, Julien and Peng, Zebo}}, issn = {{0923-8174}}, keywords = {{testing; test scheduling; abort-on-fail}}, language = {{eng}}, number = {{6}}, pages = {{651--658}}, publisher = {{Springer}}, series = {{Journal of Electronic Testing}}, title = {{Abort-on-Fail Based Test Scheduling}}, url = {{http://dx.doi.org/10.1007/s10836-005-4597-z}}, doi = {{10.1007/s10836-005-4597-z}}, volume = {{21}}, year = {{2005}}, }