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Abort-on-Fail Based Test Scheduling

Larsson, Erik LU ; Pouget, Julien and Peng, Zebo (2005) In Journal of Electronic Testing 21(6). p.651-658
Abstract
The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect... (More)
The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect probabilitiesinto account. (Less)
Please use this url to cite or link to this publication:
author
publishing date
type
Contribution to journal
publication status
published
subject
keywords
testing, test scheduling, abort-on-fail
in
Journal of Electronic Testing
volume
21
issue
6
pages
651 - 658
publisher
Springer
external identifiers
  • scopus:27844610759
ISSN
0923-8174
DOI
10.1007/s10836-005-4597-z
language
English
LU publication?
no
id
e8c59741-1ba6-4989-b350-ead226c27e16 (old id 2341062)
date added to LUP
2012-02-10 13:35:09
date last changed
2017-01-01 07:36:15
@article{e8c59741-1ba6-4989-b350-ead226c27e16,
  abstract     = {The long andincreasing test application time for modular core-basedsystem-on-chips is a major problem, and many approaches have beendeveloped to deal with the problem. Different from previousapproaches, where it is assumed that all tests will be performeduntil completion, we consider the cases where the test process isterminated as soon as a defect is detected. Such abort-on-failtesting is common practice in production test of chips. We define amodel to compute the expected test time for a given test schedulein an abort-on-fail environment. We have implemented threescheduling techniques and the experimental results show asignificant test time reduction (up to 90%) when making use of anefficient test scheduling technique that takes defect probabilitiesinto account.},
  author       = {Larsson, Erik and Pouget, Julien and Peng, Zebo},
  issn         = {0923-8174},
  keyword      = {testing,test scheduling,abort-on-fail},
  language     = {eng},
  number       = {6},
  pages        = {651--658},
  publisher    = {Springer},
  series       = {Journal of Electronic Testing},
  title        = {Abort-on-Fail Based Test Scheduling},
  url          = {http://dx.doi.org/10.1007/s10836-005-4597-z},
  volume       = {21},
  year         = {2005},
}