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Trace Elemental Analysis by Means of Heavy Particle-Induced X-Rays

Johansson, Sven A E; Ahlberg, Mats; Akselsson, Roland LU ; Bohgard, Mats LU ; Carlsson, Lars-Eric; Hansson, Hans-Christen; Johansson, Gerd LU ; Johansson, Thomas B LU ; Lannefors, Hans and Malmqvist, Klas LU (1978) In Progress Report for IAEA, Research Agreement No. 1459/R2/CF, January 1975 - December 1977
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Book/Report
publication status
published
subject
keywords
Particle Induced X-ray Emission Analysis, PIXE, applications of PIXE
in
Progress Report for IAEA, Research Agreement No. 1459/R2/CF, January 1975 - December 1977
pages
17 pages
publisher
Department of Nuclear Physics, Lund Institute of Technology
language
English
LU publication?
yes
id
dee98129-eb02-4bff-ba3b-d3c8e90af143 (old id 2540750)
date added to LUP
2012-05-28 22:54:06
date last changed
2016-04-16 09:43:04
@techreport{dee98129-eb02-4bff-ba3b-d3c8e90af143,
  author       = {Johansson, Sven A E and Ahlberg, Mats and Akselsson, Roland and Bohgard, Mats and Carlsson, Lars-Eric and Hansson, Hans-Christen and Johansson, Gerd and Johansson, Thomas B and Lannefors, Hans and Malmqvist, Klas},
  institution  = {Department of Nuclear Physics, Lund Institute of Technology},
  keyword      = {Particle Induced X-ray Emission Analysis,PIXE,applications of PIXE},
  language     = {eng},
  pages        = {17},
  series       = {Progress Report for IAEA, Research Agreement No. 1459/R2/CF, January 1975 - December 1977},
  title        = {Trace Elemental Analysis by Means of Heavy Particle-Induced X-Rays},
  year         = {1978},
}