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Re-using Chip Level DFT at Board Level

Gu, Xinli; Rearick, Jeff; Eklow, Bill; Qian, Jun; Jutman, Artur; Chakrabarty, Krishnendu and Larsson, Erik LU (2012) European Test Symposium In [Host publication title missing] p.205-205
Abstract
As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Board test, board diagnosis, chip access, IEEE P1687, IEEE 1149.1
in
[Host publication title missing]
pages
1 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
European Test Symposium
external identifiers
  • scopus:84864714878
language
English
LU publication?
yes
id
0058eb93-f749-4b1e-890c-7e32ca96a97f (old id 2732595)
date added to LUP
2012-06-07 15:08:55
date last changed
2017-01-01 08:06:35
@inproceedings{0058eb93-f749-4b1e-890c-7e32ca96a97f,
  abstract     = {As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?},
  author       = {Gu, Xinli and Rearick, Jeff and Eklow, Bill and Qian, Jun and Jutman, Artur and Chakrabarty, Krishnendu and Larsson, Erik},
  booktitle    = {[Host publication title missing]},
  keyword      = {Board test,board diagnosis,chip access,IEEE P1687,IEEE 1149.1},
  language     = {eng},
  pages        = {205--205},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Re-using Chip Level DFT at Board Level},
  year         = {2012},
}