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Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system

Osterhoff, Markus ; Robisch, Anna Lena ; Soltau, Jakob ; Eckermann, Marina ; Kalbfleisch, Sebastian LU ; Carbone, Dina LU ; Johansson, Ulf LU and Salditt, Tim (2019) In Journal of Synchrotron Radiation 26(4). p.1173-1180
Abstract

The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence |μ| has been quantified as a function of the secondary source aperture (SSA); the coherence is larger than 50% for SSA sizes below 11 µm at hard X-ray energies of 14 keV. For an SSA size of 5 µm, the degree of coherence has been determined to be 87%.

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author
; ; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
coherence, holography, nano-focus
in
Journal of Synchrotron Radiation
volume
26
issue
4
pages
1173 - 1180
publisher
International Union of Crystallography
external identifiers
  • pmid:31274441
  • scopus:85067657088
ISSN
0909-0495
DOI
10.1107/S1600577519003886
language
English
LU publication?
yes
id
28420409-b6ee-48ec-869e-cb2689fb312a
date added to LUP
2019-07-08 15:24:09
date last changed
2024-04-02 14:11:41
@article{28420409-b6ee-48ec-869e-cb2689fb312a,
  abstract     = {{<p>The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence |μ| has been quantified as a function of the secondary source aperture (SSA); the coherence is larger than 50% for SSA sizes below 11 µm at hard X-ray energies of 14 keV. For an SSA size of 5 µm, the degree of coherence has been determined to be 87%.</p>}},
  author       = {{Osterhoff, Markus and Robisch, Anna Lena and Soltau, Jakob and Eckermann, Marina and Kalbfleisch, Sebastian and Carbone, Dina and Johansson, Ulf and Salditt, Tim}},
  issn         = {{0909-0495}},
  keywords     = {{coherence; holography; nano-focus}},
  language     = {{eng}},
  number       = {{4}},
  pages        = {{1173--1180}},
  publisher    = {{International Union of Crystallography}},
  series       = {{Journal of Synchrotron Radiation}},
  title        = {{Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system}},
  url          = {{http://dx.doi.org/10.1107/S1600577519003886}},
  doi          = {{10.1107/S1600577519003886}},
  volume       = {{26}},
  year         = {{2019}},
}