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Counting dislocations in microcrystals by coherent X-Ray diffraction

Jacques, V. L.R. ; Carbone, D. LU ; Ghisleni, R. and Thilly, L. (2013) In Physical Review Letters 111(6).
Abstract

We present here an unprecedented way of quantifying the number of dislocations in microcrystals. This method relies on a combination of several state-of-the-art techniques: coherent x-ray diffraction used as a local probe, together with the controlled compression of micro-objects. We demonstrate that by using this method, dislocations in the microcrystal can be detected and their number precisely quantified. This cannot be done with other techniques in a nondestructive way. Our method opens a route for the study of many small-scale systems with defect-dependent physical properties and it could become a critical tool for addressing future challenges in nanotechnology.

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author
; ; and
publishing date
type
Contribution to journal
publication status
published
in
Physical Review Letters
volume
111
issue
6
article number
065503
publisher
American Physical Society
external identifiers
  • scopus:84881514207
ISSN
0031-9007
DOI
10.1103/PhysRevLett.111.065503
language
English
LU publication?
no
id
2a3dd379-b3d2-4657-907f-977593991c53
date added to LUP
2021-12-15 11:46:35
date last changed
2025-10-14 11:31:29
@article{2a3dd379-b3d2-4657-907f-977593991c53,
  abstract     = {{<p>We present here an unprecedented way of quantifying the number of dislocations in microcrystals. This method relies on a combination of several state-of-the-art techniques: coherent x-ray diffraction used as a local probe, together with the controlled compression of micro-objects. We demonstrate that by using this method, dislocations in the microcrystal can be detected and their number precisely quantified. This cannot be done with other techniques in a nondestructive way. Our method opens a route for the study of many small-scale systems with defect-dependent physical properties and it could become a critical tool for addressing future challenges in nanotechnology.</p>}},
  author       = {{Jacques, V. L.R. and Carbone, D. and Ghisleni, R. and Thilly, L.}},
  issn         = {{0031-9007}},
  language     = {{eng}},
  month        = {{08}},
  number       = {{6}},
  publisher    = {{American Physical Society}},
  series       = {{Physical Review Letters}},
  title        = {{Counting dislocations in microcrystals by coherent X-Ray diffraction}},
  url          = {{http://dx.doi.org/10.1103/PhysRevLett.111.065503}},
  doi          = {{10.1103/PhysRevLett.111.065503}},
  volume       = {{111}},
  year         = {{2013}},
}