A superbright X-ray laboratory microsource empowered by a novel restoration algorithm
(2012) In Journal of Applied Crystallography 45(6). p.1228-1235- Abstract
The properties of nanoscale materials vary with the size and shape of the building blocks, which can be measured by (grazing-incidence) small-angle X-ray scattering along with the mutual positions of the nanoparticles. The accuracy in the determination of such parameters is dependent on the signal-to-noise ratio of the X-ray scattering pattern and on the visibility of the interference fringes. Here, a first-generation-synchrotron-class X-ray laboratory microsource was used in combination with a new restoration algorithm to probe nanoscale-assembled superstructures. The proposed algorithm, based on a maximum likelihood approach, allows one to deconvolve the beam-divergence effects from data and to restore, at least partially, missing... (More)
The properties of nanoscale materials vary with the size and shape of the building blocks, which can be measured by (grazing-incidence) small-angle X-ray scattering along with the mutual positions of the nanoparticles. The accuracy in the determination of such parameters is dependent on the signal-to-noise ratio of the X-ray scattering pattern and on the visibility of the interference fringes. Here, a first-generation-synchrotron-class X-ray laboratory microsource was used in combination with a new restoration algorithm to probe nanoscale-assembled superstructures. The proposed algorithm, based on a maximum likelihood approach, allows one to deconvolve the beam-divergence effects from data and to restore, at least partially, missing data cut away by the beam stopper. It is shown that the combination of a superbright X-ray laboratory microsource with the data-restoring method allows a virtual enhancement of the instrument brilliance, improving signal-to-noise ratio and fringe visibility and reaching levels of performance comparable to third-generation synchrotron radiation beamlines.
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- author
- De Caro, Liberato ; Altamura, Davide ; Vittoria, Fabio Alessio ; Carbone, Gerardina LU ; Qiao, Fen ; Manna, Liberato and Giannini, Cinzia
- publishing date
- 2012-12
- type
- Contribution to journal
- publication status
- published
- keywords
- deconvolution algorithms, grazing-incidence small-angle X-ray scattering (GISAXS), microfocus, nanomaterials, X-ray imaging
- in
- Journal of Applied Crystallography
- volume
- 45
- issue
- 6
- pages
- 8 pages
- publisher
- International Union of Crystallography
- external identifiers
-
- scopus:84869192771
- ISSN
- 0021-8898
- DOI
- 10.1107/S0021889812042161
- language
- English
- LU publication?
- no
- id
- 2d0ca7ba-99de-4d93-b706-2c5e9316d58c
- date added to LUP
- 2021-12-15 12:03:21
- date last changed
- 2022-02-02 02:08:44
@article{2d0ca7ba-99de-4d93-b706-2c5e9316d58c,
abstract = {{<p>The properties of nanoscale materials vary with the size and shape of the building blocks, which can be measured by (grazing-incidence) small-angle X-ray scattering along with the mutual positions of the nanoparticles. The accuracy in the determination of such parameters is dependent on the signal-to-noise ratio of the X-ray scattering pattern and on the visibility of the interference fringes. Here, a first-generation-synchrotron-class X-ray laboratory microsource was used in combination with a new restoration algorithm to probe nanoscale-assembled superstructures. The proposed algorithm, based on a maximum likelihood approach, allows one to deconvolve the beam-divergence effects from data and to restore, at least partially, missing data cut away by the beam stopper. It is shown that the combination of a superbright X-ray laboratory microsource with the data-restoring method allows a virtual enhancement of the instrument brilliance, improving signal-to-noise ratio and fringe visibility and reaching levels of performance comparable to third-generation synchrotron radiation beamlines.</p>}},
author = {{De Caro, Liberato and Altamura, Davide and Vittoria, Fabio Alessio and Carbone, Gerardina and Qiao, Fen and Manna, Liberato and Giannini, Cinzia}},
issn = {{0021-8898}},
keywords = {{deconvolution algorithms; grazing-incidence small-angle X-ray scattering (GISAXS); microfocus; nanomaterials; X-ray imaging}},
language = {{eng}},
number = {{6}},
pages = {{1228--1235}},
publisher = {{International Union of Crystallography}},
series = {{Journal of Applied Crystallography}},
title = {{A superbright X-ray laboratory microsource empowered by a novel restoration algorithm}},
url = {{http://dx.doi.org/10.1107/S0021889812042161}},
doi = {{10.1107/S0021889812042161}},
volume = {{45}},
year = {{2012}},
}