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- 2020
- Reconstructing intragranular strain fields in polycrystalline materials from scanning 3DXRD data
-
PtyNAMi : Ptychographic nano-analytical microscope
Schropp, Andreas ; Dohrmann, Ralph ; Botta, Stephan ; Bruckner, Dennis ; Kahnt, Maik LU
; Lyubomirskiy, Mikhail
; Ossig, Christina
; Scholz, Maria
; Seyrich, Martin
and Stuckelberger, Michael E.
, et al.
(2020)
In Journal of Applied Crystallography
53.
p.957-971
Mark
- X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires
- 2019
-
A simple correction for the parallax effect in X-ray pair distribution function measurements
Marlton, Frederick ; Ivashko, Oleh ; Zimmerman, Martin V. ; Gutowski, Olof ; Dippel, Ann Christin and Jørgensen, Mads Ry Vogel LU
(2019)
In Journal of Applied Crystallography
52.
p.1072-1076
Mark
- 2018
- Recent upgrades of the neutron reflectometer D17 at ILL
- Optimization of moderators and beam extraction at the ESS
- 2017
- Instrumental resolution as a function of scattering angle and wavelength as exemplified for the POWGEN instrument
- 2016
- Efficient computation of the scattering intensity from systems of nonspherical particles
- In situ time-of-flight neutron imaging of NiO-YSZ anode support reduction under influence of stress
-
Direct monitoring of calcium-triggered phase transitions in cubosomes using small-angle X-ray scattering combined with microfluidics
Ghazal, Aghiad ; Gontsarik, Mark ; Kutter, Jörg P. ; Lafleur, Josiane P. ; Labrador, Ana LU
; Mortensen, Kell
and Yaghmur, Anan
(2016)
In Journal of Applied Crystallography
49(6).
p.2005-2014
Mark