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Accessing Embedded DfT Instruments with IEEE P1687

Larsson, Erik LU and Ghani Zadegan, Farrokh LU (2012) IEEE 21st Asian Test Symposium (ATS) In IEEE 21st Asian Test Symposium (ATS), 2012 p.71-76
Abstract
While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1... (More)
While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
IEEE P1687 IJTAG, IEEE 1149.1, embedded instruments
in
IEEE 21st Asian Test Symposium (ATS), 2012
pages
71 - 76
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
IEEE 21st Asian Test Symposium (ATS)
external identifiers
  • scopus:84872510082
ISSN
1081-7735
ISBN
978-1-4673-4555-2
DOI
10.1109/ATS.2012.74
language
English
LU publication?
yes
id
03076f42-6364-48e3-97b3-2a19b474b769 (old id 3173262)
date added to LUP
2012-11-20 11:36:45
date last changed
2017-08-27 04:39:21
@inproceedings{03076f42-6364-48e3-97b3-2a19b474b769,
  abstract     = {While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.},
  author       = {Larsson, Erik and Ghani Zadegan, Farrokh},
  booktitle    = {IEEE 21st Asian Test Symposium (ATS), 2012},
  isbn         = {978-1-4673-4555-2},
  issn         = {1081-7735},
  keyword      = {IEEE P1687 IJTAG,IEEE 1149.1,embedded instruments},
  language     = {eng},
  pages        = {71--76},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Accessing Embedded DfT Instruments with IEEE P1687},
  url          = {http://dx.doi.org/10.1109/ATS.2012.74},
  year         = {2012},
}