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Operando Surface Characterization of InP Nanowire p-n Junctions

McKibbin, Sarah R. LU orcid ; Colvin, Jovana LU ; Troian, Andrea LU ; Knutsson, Johan V. LU ; Webb, James L. LU ; Otnes, Gaute LU ; Dirscherl, Kai ; Sezen, Hikmet ; Amati, Matteo and Gregoratti, Luca , et al. (2020) In Nano Letters 20(2). p.887-895
Abstract

We present an in-depth analysis of the surface band alignment and local potential distribution of InP nanowires containing a p-n junction using scanning probe and photoelectron microscopy techniques. The depletion region is localized to a 15 nm thin surface region by scanning tunneling spectroscopy and an electronic shift of up to 0.5 eV between the n- A nd p-doped nanowire segments was observed and confirmed by Kelvin probe force microscopy. Scanning photoelectron microscopy then allowed us to measure the intrinsic chemical shift of the In 3d, In 4d, and P 2p core level spectra along the nanowire and the effect of operating the nanowire diode in forward and reverse bias on these shifts. Thanks to the high-resolution techniques... (More)

We present an in-depth analysis of the surface band alignment and local potential distribution of InP nanowires containing a p-n junction using scanning probe and photoelectron microscopy techniques. The depletion region is localized to a 15 nm thin surface region by scanning tunneling spectroscopy and an electronic shift of up to 0.5 eV between the n- A nd p-doped nanowire segments was observed and confirmed by Kelvin probe force microscopy. Scanning photoelectron microscopy then allowed us to measure the intrinsic chemical shift of the In 3d, In 4d, and P 2p core level spectra along the nanowire and the effect of operating the nanowire diode in forward and reverse bias on these shifts. Thanks to the high-resolution techniques utilized, we observe fluctuations in the potential and chemical energy of the surface along the nanowire in great detail, exposing the sensitive nature of nanodevices to small scale structural variations.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
InP nanowire, KPFM, pn-junction, SPEM, STM, surface potential
in
Nano Letters
volume
20
issue
2
pages
9 pages
publisher
The American Chemical Society (ACS)
external identifiers
  • pmid:31891513
  • scopus:85078430908
ISSN
1530-6984
DOI
10.1021/acs.nanolett.9b03529
language
English
LU publication?
yes
id
3f65ac84-5121-41f6-84c8-f21a6eae1fe0
date added to LUP
2020-02-10 14:08:52
date last changed
2024-06-13 11:24:18
@article{3f65ac84-5121-41f6-84c8-f21a6eae1fe0,
  abstract     = {{<p>We present an in-depth analysis of the surface band alignment and local potential distribution of InP nanowires containing a p-n junction using scanning probe and photoelectron microscopy techniques. The depletion region is localized to a 15 nm thin surface region by scanning tunneling spectroscopy and an electronic shift of up to 0.5 eV between the n- A nd p-doped nanowire segments was observed and confirmed by Kelvin probe force microscopy. Scanning photoelectron microscopy then allowed us to measure the intrinsic chemical shift of the In 3d, In 4d, and P 2p core level spectra along the nanowire and the effect of operating the nanowire diode in forward and reverse bias on these shifts. Thanks to the high-resolution techniques utilized, we observe fluctuations in the potential and chemical energy of the surface along the nanowire in great detail, exposing the sensitive nature of nanodevices to small scale structural variations.</p>}},
  author       = {{McKibbin, Sarah R. and Colvin, Jovana and Troian, Andrea and Knutsson, Johan V. and Webb, James L. and Otnes, Gaute and Dirscherl, Kai and Sezen, Hikmet and Amati, Matteo and Gregoratti, Luca and Borgström, Magnus T. and Mikkelsen, Anders and Timm, Rainer}},
  issn         = {{1530-6984}},
  keywords     = {{InP nanowire; KPFM; pn-junction; SPEM; STM; surface potential}},
  language     = {{eng}},
  number       = {{2}},
  pages        = {{887--895}},
  publisher    = {{The American Chemical Society (ACS)}},
  series       = {{Nano Letters}},
  title        = {{Operando Surface Characterization of InP Nanowire p-n Junctions}},
  url          = {{http://dx.doi.org/10.1021/acs.nanolett.9b03529}},
  doi          = {{10.1021/acs.nanolett.9b03529}},
  volume       = {{20}},
  year         = {{2020}},
}