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X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.

Keplinger, Mario; Mandl, Bernhard LU ; Kriegner, Dominik; Holý, Václav; Samuelson, Lars LU ; Bauer, Günther; Deppert, Knut LU and Stangl, Julian (2015) In Journal of Synchrotron Radiation 22(Pt 1). p.59-66
Abstract
The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Journal of Synchrotron Radiation
volume
22
issue
Pt 1
pages
59 - 66
publisher
Wiley-Blackwell
external identifiers
  • pmid:25537589
  • wos:000346850200010
  • scopus:84919961677
ISSN
1600-5775
DOI
10.1107/S160057751402284X
language
English
LU publication?
yes
id
1bd0db7f-4fc5-433d-9313-77099a3325eb (old id 4905687)
date added to LUP
2015-01-12 09:43:28
date last changed
2017-09-03 03:18:51
@article{1bd0db7f-4fc5-433d-9313-77099a3325eb,
  abstract     = {The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.},
  author       = {Keplinger, Mario and Mandl, Bernhard and Kriegner, Dominik and Holý, Václav and Samuelson, Lars and Bauer, Günther and Deppert, Knut and Stangl, Julian},
  issn         = {1600-5775},
  language     = {eng},
  number       = {Pt 1},
  pages        = {59--66},
  publisher    = {Wiley-Blackwell},
  series       = {Journal of Synchrotron Radiation},
  title        = {X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.},
  url          = {http://dx.doi.org/10.1107/S160057751402284X},
  volume       = {22},
  year         = {2015},
}