Temperature dependent properties of InSb and InAs nanowire field-effect transistors
(2010) In Applied Physics Letters 96(15).- Abstract
- We present temperature dependent electrical measurements on InSb and InAs nanowire field-effect transistors (FETs). The FETs are fabricated from InAs/InSb heterostructure nanowires, where one complete transistor is defined within each of the two segments. Both the InSb and the InAs FETs are n-type with good current saturation and low voltage operation. The off-current for the InSb FET shows a strong temperature dependence, which we attribute to a barrier lowering due to an increased band-to-band tunneling in the drain part of the channel.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1603317
- author
- Nilsson, Henrik
LU
; Caroff, Philippe
LU
; Thelander, Claes
LU
; Lind, Erik
LU
; Karlström, Olov
LU
and Wernersson, Lars-Erik
LU
- organization
- publishing date
- 2010
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- field effect transistors, nanowires
- in
- Applied Physics Letters
- volume
- 96
- issue
- 15
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- wos:000276794100075
- scopus:77951614503
- ISSN
- 0003-6951
- DOI
- 10.1063/1.3402760
- language
- English
- LU publication?
- yes
- id
- 4b8e75fe-1407-4ce5-8df9-e731071949dc (old id 1603317)
- date added to LUP
- 2016-04-01 09:57:58
- date last changed
- 2025-11-27 15:37:01
@article{4b8e75fe-1407-4ce5-8df9-e731071949dc,
abstract = {{We present temperature dependent electrical measurements on InSb and InAs nanowire field-effect transistors (FETs). The FETs are fabricated from InAs/InSb heterostructure nanowires, where one complete transistor is defined within each of the two segments. Both the InSb and the InAs FETs are n-type with good current saturation and low voltage operation. The off-current for the InSb FET shows a strong temperature dependence, which we attribute to a barrier lowering due to an increased band-to-band tunneling in the drain part of the channel.}},
author = {{Nilsson, Henrik and Caroff, Philippe and Thelander, Claes and Lind, Erik and Karlström, Olov and Wernersson, Lars-Erik}},
issn = {{0003-6951}},
keywords = {{field effect transistors; nanowires}},
language = {{eng}},
number = {{15}},
publisher = {{American Institute of Physics (AIP)}},
series = {{Applied Physics Letters}},
title = {{Temperature dependent properties of InSb and InAs nanowire field-effect transistors}},
url = {{http://dx.doi.org/10.1063/1.3402760}},
doi = {{10.1063/1.3402760}},
volume = {{96}},
year = {{2010}},
}