Electron channelling : challenges and opportunities for compositional analysis of nanowires by TEM
Ek, M. LU
; Lehmann, Sebastian
LU
and Wallenberg, Reine
LU
(2020)
In Nanotechnology
31(36).
- Abstract
Energy dispersive x-ray spectroscopy in a transmission electron microscope is often the first method employed to characterize the composition of nanowires. Ideally, it should be accurate and sensitive down to fractions of an atomic percent, and quantification results are often reported as such. However, one can often get substantial errors in accuracy even though the precision is high: for nanowires it is common for the quantified V/III atomic ratios to differ noticeably from 1. Here we analyse the origin of this systematic error in accuracy for quantification of the composition of III-V nanowires. By varying the electron illumination direction, we find electron channelling to be the primary cause, being responsible for errors in... (More)
Energy dispersive x-ray spectroscopy in a transmission electron microscope is often the first method employed to characterize the composition of nanowires. Ideally, it should be accurate and sensitive down to fractions of an atomic percent, and quantification results are often reported as such. However, one can often get substantial errors in accuracy even though the precision is high: for nanowires it is common for the quantified V/III atomic ratios to differ noticeably from 1. Here we analyse the origin of this systematic error in accuracy for quantification of the composition of III-V nanowires. By varying the electron illumination direction, we find electron channelling to be the primary cause, being responsible for errors in quantified V/III atomic ratio of 50%. Knowing the source of the systematic errors is required for applying appropriate corrections. Lastly, we show how channelling effects can provide information on the crystallographic position of dopants.
(Less)
- author
- Ek, M.
LU
; Lehmann, Sebastian
LU
and Wallenberg, Reine
LU
- organization
- publishing date
- 2020
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Nanotechnology
- volume
- 31
- issue
- 36
- article number
- 364005
- publisher
- IOP Publishing
- external identifiers
-
- scopus:85087110897
- pmid:32454471
- ISSN
- 0957-4484
- DOI
- 10.1088/1361-6528/ab9679
- language
- English
- LU publication?
- yes
- id
- 4c265574-2ed6-438d-8578-ccae1fa149fe
- date added to LUP
- 2020-07-07 09:43:23
- date last changed
- 2024-04-03 10:09:12
@article{4c265574-2ed6-438d-8578-ccae1fa149fe,
abstract = {{<p>Energy dispersive x-ray spectroscopy in a transmission electron microscope is often the first method employed to characterize the composition of nanowires. Ideally, it should be accurate and sensitive down to fractions of an atomic percent, and quantification results are often reported as such. However, one can often get substantial errors in accuracy even though the precision is high: for nanowires it is common for the quantified V/III atomic ratios to differ noticeably from 1. Here we analyse the origin of this systematic error in accuracy for quantification of the composition of III-V nanowires. By varying the electron illumination direction, we find electron channelling to be the primary cause, being responsible for errors in quantified V/III atomic ratio of 50%. Knowing the source of the systematic errors is required for applying appropriate corrections. Lastly, we show how channelling effects can provide information on the crystallographic position of dopants.</p>}},
author = {{Ek, M. and Lehmann, Sebastian and Wallenberg, Reine}},
issn = {{0957-4484}},
language = {{eng}},
number = {{36}},
publisher = {{IOP Publishing}},
series = {{Nanotechnology}},
title = {{Electron channelling : challenges and opportunities for compositional analysis of nanowires by TEM}},
url = {{http://dx.doi.org/10.1088/1361-6528/ab9679}},
doi = {{10.1088/1361-6528/ab9679}},
volume = {{31}},
year = {{2020}},
}