X-ray analysis of nanowires and nanowire devices : structure, function and synthesis
Chayanun, Lert LU ; Benter, Sandra LU ; Mikkelsen, Anders LU ; Timm, Rainer LU
and Wallentin, Jesper
LU
(2025)
In Nanotechnology
36(15).
- Abstract
X-ray methods can offer unique insights into the structural and electronic properties of nanomaterials. Recent years have seen a dramatic improvement in both x-ray sources and x-ray optics, providing unprecedented resolution and sensitivity. These developments are particularly useful for nanowires, which are inherently small and give weak signals. This review gives an overview of how different x-ray methods have been used to analyze nanowires, showing the different types of insight that can be gained. The methods that are discussed include x-ray diffraction, x-ray fluorescence, x-ray photoelectron spectroscopy and x-ray photoelectron emission microscopy, as well as several others. The review is especially focused on high spatial... (More)
X-ray methods can offer unique insights into the structural and electronic properties of nanomaterials. Recent years have seen a dramatic improvement in both x-ray sources and x-ray optics, providing unprecedented resolution and sensitivity. These developments are particularly useful for nanowires, which are inherently small and give weak signals. This review gives an overview of how different x-ray methods have been used to analyze nanowires, showing the different types of insight that can be gained. The methods that are discussed include x-ray diffraction, x-ray fluorescence, x-ray photoelectron spectroscopy and x-ray photoelectron emission microscopy, as well as several others. The review is especially focused on high spatial resolution methods used at the single nanowire level, but it also covers ensemble experiments.
(Less)
- author
- Chayanun, Lert
LU
; Benter, Sandra
LU
; Mikkelsen, Anders
LU
; Timm, Rainer
LU
and Wallentin, Jesper
LU
- organization
- publishing date
- 2025-04-14
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- devices, nanowires, structures, synthesis, x-ray analysis
- in
- Nanotechnology
- volume
- 36
- issue
- 15
- article number
- 152001
- publisher
- IOP Publishing
- external identifiers
-
- pmid:40016941
- scopus:86000190062
- ISSN
- 0957-4484
- DOI
- 10.1088/1361-6528/adb6a9
- language
- English
- LU publication?
- yes
- additional info
- Publisher Copyright: © 2025 The Author(s). Published by IOP Publishing Ltd.
- id
- 511a7534-b6d0-49f1-8d06-98fb122257ac
- date added to LUP
- 2025-03-24 13:10:07
- date last changed
- 2025-07-14 19:51:10
@article{511a7534-b6d0-49f1-8d06-98fb122257ac,
abstract = {{<p>X-ray methods can offer unique insights into the structural and electronic properties of nanomaterials. Recent years have seen a dramatic improvement in both x-ray sources and x-ray optics, providing unprecedented resolution and sensitivity. These developments are particularly useful for nanowires, which are inherently small and give weak signals. This review gives an overview of how different x-ray methods have been used to analyze nanowires, showing the different types of insight that can be gained. The methods that are discussed include x-ray diffraction, x-ray fluorescence, x-ray photoelectron spectroscopy and x-ray photoelectron emission microscopy, as well as several others. The review is especially focused on high spatial resolution methods used at the single nanowire level, but it also covers ensemble experiments.</p>}},
author = {{Chayanun, Lert and Benter, Sandra and Mikkelsen, Anders and Timm, Rainer and Wallentin, Jesper}},
issn = {{0957-4484}},
keywords = {{devices; nanowires; structures; synthesis; x-ray analysis}},
language = {{eng}},
month = {{04}},
number = {{15}},
publisher = {{IOP Publishing}},
series = {{Nanotechnology}},
title = {{X-ray analysis of nanowires and nanowire devices : structure, function and synthesis}},
url = {{http://dx.doi.org/10.1088/1361-6528/adb6a9}},
doi = {{10.1088/1361-6528/adb6a9}},
volume = {{36}},
year = {{2025}},
}