Fabrication and modeling of a combined gold nanoparticle-carbon nanotube single electron transistor
(2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)- Abstract
- Scanning probe manipulation has been used to electrically connect two carbon nanotubes to an individual 7 nm gold particle, resulting in a system with multiple tunnel junctions. Single-electron charging effects in the gold particle was found to dominate the electrical transport measurements at T=4.2 K, whereas charging effects in the two carbon nanotube leads appeared as a fine structure. A simulation of the electrical transport in the system has been carried out using SIMON*, which is a Monte Carlo based simulation program for single-electronics. Using this program we have been able to fit a model to the experimental data and to explain the electrical transport characteristics
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/611146
- author
- Thelander, Claes LU ; Magnusson, Martin LU ; Deppert, Knut LU ; Samuelson, Lars LU ; Poulsen, P.R. ; Nygard, J. and Borggreen, J.
- organization
- publishing date
- 2002
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- electrical transport measurements, single electron charging effects, multiple tunnel junctions, electrical contacts, scanning probe manipulation, transistor modelling, transistor fabrication, single electron transistor, gold nanoparticle, carbon nanotube, fine structure, simulation of nanostructures, Monte Carlo based simulation, 7 nm, 4.2 K, Au-C
- host publication
- 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
- pages
- 2 pages
- publisher
- Lund University
- conference name
- Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- conference location
- Malmö, Sweden
- conference dates
- 2002-06-24 - 2002-06-28
- language
- English
- LU publication?
- yes
- id
- 4c7a8210-eeab-4912-b649-060debccd4ca (old id 611146)
- date added to LUP
- 2016-04-04 10:10:33
- date last changed
- 2019-03-08 03:30:26
@inproceedings{4c7a8210-eeab-4912-b649-060debccd4ca, abstract = {{Scanning probe manipulation has been used to electrically connect two carbon nanotubes to an individual 7 nm gold particle, resulting in a system with multiple tunnel junctions. Single-electron charging effects in the gold particle was found to dominate the electrical transport measurements at T=4.2 K, whereas charging effects in the two carbon nanotube leads appeared as a fine structure. A simulation of the electrical transport in the system has been carried out using SIMON*, which is a Monte Carlo based simulation program for single-electronics. Using this program we have been able to fit a model to the experimental data and to explain the electrical transport characteristics}}, author = {{Thelander, Claes and Magnusson, Martin and Deppert, Knut and Samuelson, Lars and Poulsen, P.R. and Nygard, J. and Borggreen, J.}}, booktitle = {{7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science}}, keywords = {{electrical transport measurements; single electron charging effects; multiple tunnel junctions; electrical contacts; scanning probe manipulation; transistor modelling; transistor fabrication; single electron transistor; gold nanoparticle; carbon nanotube; fine structure; simulation of nanostructures; Monte Carlo based simulation; 7 nm; 4.2 K; Au-C}}, language = {{eng}}, publisher = {{Lund University}}, title = {{Fabrication and modeling of a combined gold nanoparticle-carbon nanotube single electron transistor}}, year = {{2002}}, }