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Power Constrained Test Scheduling for 3D Stacked Chips: poster

Sengupta, Breeta LU ; Ingelsson, Urban and Larsson, Erik LU orcid (2010) 1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits
Please use this url to cite or link to this publication:
author
; and
organization
publishing date
type
Contribution to conference
publication status
published
subject
conference name
1st IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits
conference location
Austin, United States
conference dates
2010-11-04 - 2010-11-05
language
English
LU publication?
no
id
844b79c2-f01f-455f-8acc-53b3e9ee2a47 (old id 2340810)
date added to LUP
2016-04-04 13:24:24
date last changed
2020-06-10 15:42:06
@misc{844b79c2-f01f-455f-8acc-53b3e9ee2a47,
  author       = {{Sengupta, Breeta and Ingelsson, Urban and Larsson, Erik}},
  language     = {{eng}},
  title        = {{Power Constrained Test Scheduling for 3D Stacked Chips: poster}},
  url          = {{https://lup.lub.lu.se/search/files/80474110/4857444.pdf}},
  year         = {{2010}},
}