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Nanofocused x-ray beams applied for mapping strain in core-shell nanowires

Stankevic, Tomas; Dzhigaev, Dmitry; Bi, Zhaoxia LU ; Rose, Max; Shabalin, Anatoly; Reinhardt, Juliane; Mikkelsen, Anders LU ; Samuelson, Lars LU ; Falkenberg, Gerald and Vartanyants, Ivan A., et al. (2015) Conference on X-Ray Nanoimaging - Instruments and Methods II In Proceedings of SPIE 9592. p.95920-95920
Abstract
The core-shell nanowires have the promise to become the future building blocks of light emitting diodes, solar cells and quantum computers. The high surface to volume ratio allows efficient elastic strain relaxation, making it possible to combine a wider range of materials into the heterostructures as compared to the traditional, planar geometry. As a result, the strain fields appear in both the core and the shell of the nanowires, which can affect the device properties. The hard x-ray nanoprobe is a tool that enables a nondestructive mapping of the strain and tilt distributions where other techniques cannot be applied. By measuring the positions of the Bragg peaks for each point on the sample we can evaluate the values of local tilt and... (More)
The core-shell nanowires have the promise to become the future building blocks of light emitting diodes, solar cells and quantum computers. The high surface to volume ratio allows efficient elastic strain relaxation, making it possible to combine a wider range of materials into the heterostructures as compared to the traditional, planar geometry. As a result, the strain fields appear in both the core and the shell of the nanowires, which can affect the device properties. The hard x-ray nanoprobe is a tool that enables a nondestructive mapping of the strain and tilt distributions where other techniques cannot be applied. By measuring the positions of the Bragg peaks for each point on the sample we can evaluate the values of local tilt and strain. In this paper we demonstrate the detailed strain mapping of the strained InGaN/GaN core-shell nanowire. We observe an asymmetric strain distribution in the GaN core caused by an uneven shell relaxation. Additionally, we analyzed the local micro-tilt distribution, which shows the edge effects at the top and bottom of the nanowire. The measurements were compared to the finite element modelling and show a good agreement. (Less)
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publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Nanowires, strain mapping, nanofocused X-rays, InGaN
in
Proceedings of SPIE
volume
9592
pages
95920 - 95920
publisher
SPIE
conference name
Conference on X-Ray Nanoimaging - Instruments and Methods II
external identifiers
  • wos:000366301500006
  • scopus:84950992019
ISSN
1996-756X
0277-786X
DOI
10.1117/12.2190693
language
English
LU publication?
yes
id
65f8c11d-cf42-419f-aad9-00fae2120aba (old id 8560101)
date added to LUP
2016-01-26 10:05:08
date last changed
2017-11-20 15:05:48
@inproceedings{65f8c11d-cf42-419f-aad9-00fae2120aba,
  abstract     = {The core-shell nanowires have the promise to become the future building blocks of light emitting diodes, solar cells and quantum computers. The high surface to volume ratio allows efficient elastic strain relaxation, making it possible to combine a wider range of materials into the heterostructures as compared to the traditional, planar geometry. As a result, the strain fields appear in both the core and the shell of the nanowires, which can affect the device properties. The hard x-ray nanoprobe is a tool that enables a nondestructive mapping of the strain and tilt distributions where other techniques cannot be applied. By measuring the positions of the Bragg peaks for each point on the sample we can evaluate the values of local tilt and strain. In this paper we demonstrate the detailed strain mapping of the strained InGaN/GaN core-shell nanowire. We observe an asymmetric strain distribution in the GaN core caused by an uneven shell relaxation. Additionally, we analyzed the local micro-tilt distribution, which shows the edge effects at the top and bottom of the nanowire. The measurements were compared to the finite element modelling and show a good agreement.},
  author       = {Stankevic, Tomas and Dzhigaev, Dmitry and Bi, Zhaoxia and Rose, Max and Shabalin, Anatoly and Reinhardt, Juliane and Mikkelsen, Anders and Samuelson, Lars and Falkenberg, Gerald and Vartanyants, Ivan A. and Feidenhans'l, Robert},
  booktitle    = {Proceedings of SPIE},
  issn         = {1996-756X},
  keyword      = {Nanowires,strain mapping,nanofocused X-rays,InGaN},
  language     = {eng},
  pages        = {95920--95920},
  publisher    = {SPIE},
  title        = {Nanofocused x-ray beams applied for mapping strain in core-shell nanowires},
  url          = {http://dx.doi.org/10.1117/12.2190693},
  volume       = {9592},
  year         = {2015},
}