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Specification of a Specimen for Accelerated Thermal Aging Tests

Reinap, Avo LU and Upadhyay, Akanksha LU (2019) 12th IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019 p.49-55
Abstract

This document presents design considerations of a sample for accelerated thermal aging tests. The proposed specimen is a parallel wired solenoid that is evaluated by using an axi-symmetric 2D finite element (FE) model in Comsol multi-physics. The aim of the design model is visualizing an interior stress distribution of an idealized coil in order to interpret the physics-of-failure in a more complex system than twisted pairs of enameled wires. Design-for-manufacture and design-for-testability aspects are considered when developing the reference FE model. Fault development is the main concern when analyzing electric field distribution across electric insulation system (EIS), and the related mechanical and thermal stresses under thermal... (More)

This document presents design considerations of a sample for accelerated thermal aging tests. The proposed specimen is a parallel wired solenoid that is evaluated by using an axi-symmetric 2D finite element (FE) model in Comsol multi-physics. The aim of the design model is visualizing an interior stress distribution of an idealized coil in order to interpret the physics-of-failure in a more complex system than twisted pairs of enameled wires. Design-for-manufacture and design-for-testability aspects are considered when developing the reference FE model. Fault development is the main concern when analyzing electric field distribution across electric insulation system (EIS), and the related mechanical and thermal stresses under thermal loading conditions from deterioration of EIS to inter-turn short-circuit. The significance of this theoretical kind of preparatory study is to design a test that can facilitate recognition of a fault development and identification of related diagnostic indicators.

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Please use this url to cite or link to this publication:
author
and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Accelerated Aging, Design for Experiments, Electric, Finite Element Method, Manufacture and Testability, Mechanic and Thermal Stresses, Numeric Field Computation, Physics of Failure, Test Object for Insulation Testing
host publication
Proceedings of the 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019
article number
8864856
pages
7 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
12th IEEE International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019
conference location
Toulouse, France
conference dates
2019-08-27 - 2019-08-30
external identifiers
  • scopus:85074277039
ISBN
9781728118321
DOI
10.1109/DEMPED.2019.8864856
language
English
LU publication?
yes
id
930abbe9-c686-4e36-8abd-4b95dbb5d6b6
date added to LUP
2019-11-21 14:19:44
date last changed
2022-04-18 19:12:23
@inproceedings{930abbe9-c686-4e36-8abd-4b95dbb5d6b6,
  abstract     = {{<p>This document presents design considerations of a sample for accelerated thermal aging tests. The proposed specimen is a parallel wired solenoid that is evaluated by using an axi-symmetric 2D finite element (FE) model in Comsol multi-physics. The aim of the design model is visualizing an interior stress distribution of an idealized coil in order to interpret the physics-of-failure in a more complex system than twisted pairs of enameled wires. Design-for-manufacture and design-for-testability aspects are considered when developing the reference FE model. Fault development is the main concern when analyzing electric field distribution across electric insulation system (EIS), and the related mechanical and thermal stresses under thermal loading conditions from deterioration of EIS to inter-turn short-circuit. The significance of this theoretical kind of preparatory study is to design a test that can facilitate recognition of a fault development and identification of related diagnostic indicators.</p>}},
  author       = {{Reinap, Avo and Upadhyay, Akanksha}},
  booktitle    = {{Proceedings of the 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives, SDEMPED 2019}},
  isbn         = {{9781728118321}},
  keywords     = {{Accelerated Aging; Design for Experiments; Electric; Finite Element Method; Manufacture and Testability; Mechanic and Thermal Stresses; Numeric Field Computation; Physics of Failure; Test Object for Insulation Testing}},
  language     = {{eng}},
  month        = {{10}},
  pages        = {{49--55}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Specification of a Specimen for Accelerated Thermal Aging Tests}},
  url          = {{http://dx.doi.org/10.1109/DEMPED.2019.8864856}},
  doi          = {{10.1109/DEMPED.2019.8864856}},
  year         = {{2019}},
}