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Probing growth defects inside nanowires

Eriksson, Johannes LU ; Mikkelsen, Anders LU ; Lundgren, Edvin LU ; Hofer, W; Cavar, E; Sköld, Niklas LU ; Samuelson, Lars LU and Seifert, Werner LU (2006) International Conference on Nanoscience and Technology, 2006 In Book of abstracts: Intl Conf on Nanosci and Technol, Basel, Switzerland (2006)
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type
Chapter in Book/Report/Conference proceeding
publication status
published
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in
Book of abstracts: Intl Conf on Nanosci and Technol, Basel, Switzerland (2006)
conference name
International Conference on Nanoscience and Technology, 2006
language
English
LU publication?
yes
id
35f1af23-93e9-495e-88fc-12aac3ae6cc6 (old id 963042)
date added to LUP
2008-01-28 17:02:56
date last changed
2016-07-12 13:56:03
@inproceedings{35f1af23-93e9-495e-88fc-12aac3ae6cc6,
  author       = {Eriksson, Johannes and Mikkelsen, Anders and Lundgren, Edvin and Hofer, W and Cavar, E and Sköld, Niklas and Samuelson, Lars and Seifert, Werner},
  booktitle    = {Book of abstracts: Intl Conf on Nanosci and Technol, Basel, Switzerland (2006)},
  language     = {eng},
  title        = {Probing growth defects inside nanowires},
  year         = {2006},
}