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Probing growth defects inside nanowires

Eriksson, Johannes LU ; Mikkelsen, Anders LU ; Lundgren, Edvin LU ; Hofer, W ; Cavar, E ; Sköld, Niklas LU ; Samuelson, Lars LU and Seifert, Werner LU (2006) International Conference on Nanoscience and Technology, 2006
Please use this url to cite or link to this publication:
author
; ; ; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Book of abstracts: Intl Conf on Nanosci and Technol, Basel, Switzerland (2006)
conference name
International Conference on Nanoscience and Technology, 2006
conference location
Basel, Switzerland
conference dates
2006-07-30 - 2006-08-04
language
English
LU publication?
yes
id
35f1af23-93e9-495e-88fc-12aac3ae6cc6 (old id 963042)
date added to LUP
2016-04-04 13:29:54
date last changed
2018-11-21 21:14:23
@inproceedings{35f1af23-93e9-495e-88fc-12aac3ae6cc6,
  author       = {Eriksson, Johannes and Mikkelsen, Anders and Lundgren, Edvin and Hofer, W and Cavar, E and Sköld, Niklas and Samuelson, Lars and Seifert, Werner},
  booktitle    = {Book of abstracts: Intl Conf on Nanosci and Technol, Basel, Switzerland (2006)},
  language     = {eng},
  title        = {Probing growth defects inside nanowires},
  year         = {2006},
}