Source reconstruction by far-field data for imaging of defects in frequency selective radomes
(2013) In Technical Report LUTEDX/(TEAT-7224)/1-14/(2013)- Abstract
- In this paper, an inverse source reconstruction method with great potential in radome diagnostics is presented.
Defects, e.g. seams in large radomes, and lattice dislocations in frequency selective surface (FSS) radomes, are inevitable, and their electrical effects demand analysis.
Here, defects in a frequency selective radome are analyzed with a method based on an integral formulation.
Several far-field measurement series, illuminating different parts of the radome wall at 9.35 GHz, are employed to determine the equivalent surface currents and image the disturbances on the radome surface.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3616481
- author
- Persson, Kristin LU ; Gustafsson, Mats LU ; Kristensson, Gerhard LU and Widenberg, Björn
- organization
- publishing date
- 2013
- type
- Book/Report
- publication status
- published
- subject
- in
- Technical Report LUTEDX/(TEAT-7224)/1-14/(2013)
- pages
- 14 pages
- publisher
- The Department of Electrical and Information Technology
- report number
- TEAT-7224
- language
- English
- LU publication?
- yes
- additional info
- Published version:IEEE Antennas and Wireless Propagation Letters, Vol. 12, pp. 480-483, 2013.
- id
- 9d5358f5-a119-4003-8317-425f79c7d8d0 (old id 3616481)
- date added to LUP
- 2016-04-04 14:32:22
- date last changed
- 2021-10-04 04:00:04
@techreport{9d5358f5-a119-4003-8317-425f79c7d8d0, abstract = {{In this paper, an inverse source reconstruction method with great potential in radome diagnostics is presented.<br/><br> Defects, e.g. seams in large radomes, and lattice dislocations in frequency selective surface (FSS) radomes, are inevitable, and their electrical effects demand analysis.<br/><br> Here, defects in a frequency selective radome are analyzed with a method based on an integral formulation.<br/><br> Several far-field measurement series, illuminating different parts of the radome wall at 9.35 GHz, are employed to determine the equivalent surface currents and image the disturbances on the radome surface.}}, author = {{Persson, Kristin and Gustafsson, Mats and Kristensson, Gerhard and Widenberg, Björn}}, institution = {{The Department of Electrical and Information Technology}}, language = {{eng}}, number = {{TEAT-7224}}, series = {{Technical Report LUTEDX/(TEAT-7224)/1-14/(2013)}}, title = {{Source reconstruction by far-field data for imaging of defects in frequency selective radomes}}, url = {{https://lup.lub.lu.se/search/files/6383584/3616482.pdf}}, year = {{2013}}, }