Low-temperature nanoscale heat transport in a gadolinium iron garnet heterostructure probed by ultrafast x-ray diffraction
(2022) In Structural Dynamics 9(4).- Abstract
Time-resolved x-ray diffraction has been used to measure the low-temperature thermal transport properties of a Pt/Gd3Fe5O12//Gd3Ga5O12 metal/oxide heterostructure relevant to applications in spin caloritronics. A pulsed femtosecond optical signal produces a rapid temperature rise in the Pt layer, followed by heat transport into the Gd3Fe5O12 (GdIG) thin film and the Gd3Ga5O12 (GGG) substrate. The time dependence of x-ray diffraction from the GdIG layer was tracked using an accelerator-based femtosecond x-ray source. The ultrafast diffraction measurements probed the intensity of the GdIG (1 -1 2) x-ray reflection in a grazing-incidence x-ray diffraction geometry. The comparison of the variation of the diffracted x-ray intensity with a... (More)
Time-resolved x-ray diffraction has been used to measure the low-temperature thermal transport properties of a Pt/Gd3Fe5O12//Gd3Ga5O12 metal/oxide heterostructure relevant to applications in spin caloritronics. A pulsed femtosecond optical signal produces a rapid temperature rise in the Pt layer, followed by heat transport into the Gd3Fe5O12 (GdIG) thin film and the Gd3Ga5O12 (GGG) substrate. The time dependence of x-ray diffraction from the GdIG layer was tracked using an accelerator-based femtosecond x-ray source. The ultrafast diffraction measurements probed the intensity of the GdIG (1 -1 2) x-ray reflection in a grazing-incidence x-ray diffraction geometry. The comparison of the variation of the diffracted x-ray intensity with a model including heat transport and the temperature dependence of the GdIG lattice parameter allows the thermal conductance of the Pt/GdIG and GdIG//GGG interfaces to be determined. Complementary synchrotron x-ray diffraction studies of the low-temperature thermal expansion properties of the GdIG layer provide a precise calibration of the temperature dependence of the GdIG lattice parameter. The interfacial thermal conductance of the Pt/GdIG and GdIG//GGG interfaces determined from the time-resolved diffraction study is of the same order of magnitude as previous reports for metal/oxide and epitaxial dielectric interfaces. The thermal parameters of the Pt/GdIG//GGG heterostructure will aid in the design and implementation of thermal transport devices and nanostructures.
(Less)
- author
- organization
- publishing date
- 2022-07-01
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Structural Dynamics
- volume
- 9
- issue
- 4
- article number
- 045101
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- scopus:85135319853
- pmid:35909634
- ISSN
- 2329-7778
- DOI
- 10.1063/4.0000154
- language
- English
- LU publication?
- yes
- additional info
- Publisher Copyright: © 2022 Author(s).
- id
- adce649c-89c4-41cd-bf7d-34e16609c865
- date added to LUP
- 2022-08-14 21:27:21
- date last changed
- 2024-09-06 02:15:57
@article{adce649c-89c4-41cd-bf7d-34e16609c865, abstract = {{<p>Time-resolved x-ray diffraction has been used to measure the low-temperature thermal transport properties of a Pt/Gd3Fe5O12//Gd3Ga5O12 metal/oxide heterostructure relevant to applications in spin caloritronics. A pulsed femtosecond optical signal produces a rapid temperature rise in the Pt layer, followed by heat transport into the Gd3Fe5O12 (GdIG) thin film and the Gd3Ga5O12 (GGG) substrate. The time dependence of x-ray diffraction from the GdIG layer was tracked using an accelerator-based femtosecond x-ray source. The ultrafast diffraction measurements probed the intensity of the GdIG (1 -1 2) x-ray reflection in a grazing-incidence x-ray diffraction geometry. The comparison of the variation of the diffracted x-ray intensity with a model including heat transport and the temperature dependence of the GdIG lattice parameter allows the thermal conductance of the Pt/GdIG and GdIG//GGG interfaces to be determined. Complementary synchrotron x-ray diffraction studies of the low-temperature thermal expansion properties of the GdIG layer provide a precise calibration of the temperature dependence of the GdIG lattice parameter. The interfacial thermal conductance of the Pt/GdIG and GdIG//GGG interfaces determined from the time-resolved diffraction study is of the same order of magnitude as previous reports for metal/oxide and epitaxial dielectric interfaces. The thermal parameters of the Pt/GdIG//GGG heterostructure will aid in the design and implementation of thermal transport devices and nanostructures.</p>}}, author = {{Sri Gyan, Deepankar and Mannix, Danny and Carbone, Dina and Sumpter, James L. and Geprägs, Stephan and Dietlein, Maxim and Gross, Rudolf and Jurgilaitis, Andrius and Pham, Van Thai and Coudert-Alteirac, Hélène and Larsson, Jörgen and Haskel, Daniel and Strempfer, Jörg and Evans, Paul G.}}, issn = {{2329-7778}}, language = {{eng}}, month = {{07}}, number = {{4}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Structural Dynamics}}, title = {{Low-temperature nanoscale heat transport in a gadolinium iron garnet heterostructure probed by ultrafast x-ray diffraction}}, url = {{http://dx.doi.org/10.1063/4.0000154}}, doi = {{10.1063/4.0000154}}, volume = {{9}}, year = {{2022}}, }