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Source reconstruction by far-field data for imaging of defects in frequency selective radomes

Persson, Kristin LU ; Gustafsson, Mats LU orcid ; Kristensson, Gerhard LU and Widenberg, Björn (2013) In IEEE Antennas and Wireless Propagation Letters 12. p.480-483
Abstract
In this paper, an inverse source reconstruction method with great potential in radome diagnostics is presented.

Defects, e.g., seams in large radomes, and lattice dislocations in frequency selective surface (FSS) radomes, are inevitable, and their electrical effects demand analysis.

Here, defects in a frequency selective radome are analyzed with a method based on an integral formulation. Several far-field measurement series, illuminating different parts of the radome wall at 9.35 GHz, are employed to determine the equivalent surface currents and image the disturbances on the radome surface.
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author
; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
radome, frequency selective surface (FSS), source reconstruction, equivalent surface currents, non-destructive testing
in
IEEE Antennas and Wireless Propagation Letters
volume
12
pages
480 - 483
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
external identifiers
  • wos:000318173100002
  • scopus:84876795958
ISSN
1548-5757
DOI
10.1109/LAWP.2013.2256100
language
English
LU publication?
yes
id
cf0b70cb-9c3c-473a-b1ca-b3b33c21df1d (old id 3629199)
date added to LUP
2016-04-01 10:47:07
date last changed
2022-01-26 02:26:55
@article{cf0b70cb-9c3c-473a-b1ca-b3b33c21df1d,
  abstract     = {{In this paper, an inverse source reconstruction method with great potential in radome diagnostics is presented.<br/><br>
Defects, e.g., seams in large radomes, and lattice dislocations in frequency selective surface (FSS) radomes, are inevitable, and their electrical effects demand analysis.<br/><br>
Here, defects in a frequency selective radome are analyzed with a method based on an integral formulation. Several far-field measurement series, illuminating different parts of the radome wall at 9.35 GHz, are employed to determine the equivalent surface currents and image the disturbances on the radome surface.}},
  author       = {{Persson, Kristin and Gustafsson, Mats and Kristensson, Gerhard and Widenberg, Björn}},
  issn         = {{1548-5757}},
  keywords     = {{radome; frequency selective surface (FSS); source reconstruction; equivalent surface currents; non-destructive testing}},
  language     = {{eng}},
  pages        = {{480--483}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  series       = {{IEEE Antennas and Wireless Propagation Letters}},
  title        = {{Source reconstruction by far-field data for imaging of defects in frequency selective radomes}},
  url          = {{http://dx.doi.org/10.1109/LAWP.2013.2256100}},
  doi          = {{10.1109/LAWP.2013.2256100}},
  volume       = {{12}},
  year         = {{2013}},
}