Source reconstruction by far-field data for imaging of defects in frequency selective radomes
(2013) In IEEE Antennas and Wireless Propagation Letters 12. p.480-483- Abstract
- In this paper, an inverse source reconstruction method with great potential in radome diagnostics is presented.
Defects, e.g., seams in large radomes, and lattice dislocations in frequency selective surface (FSS) radomes, are inevitable, and their electrical effects demand analysis.
Here, defects in a frequency selective radome are analyzed with a method based on an integral formulation. Several far-field measurement series, illuminating different parts of the radome wall at 9.35 GHz, are employed to determine the equivalent surface currents and image the disturbances on the radome surface.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3629199
- author
- Persson, Kristin LU ; Gustafsson, Mats LU ; Kristensson, Gerhard LU and Widenberg, Björn
- organization
- publishing date
- 2013
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- radome, frequency selective surface (FSS), source reconstruction, equivalent surface currents, non-destructive testing
- in
- IEEE Antennas and Wireless Propagation Letters
- volume
- 12
- pages
- 480 - 483
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- external identifiers
-
- wos:000318173100002
- scopus:84876795958
- ISSN
- 1548-5757
- DOI
- 10.1109/LAWP.2013.2256100
- language
- English
- LU publication?
- yes
- id
- cf0b70cb-9c3c-473a-b1ca-b3b33c21df1d (old id 3629199)
- date added to LUP
- 2016-04-01 10:47:07
- date last changed
- 2022-01-26 02:26:55
@article{cf0b70cb-9c3c-473a-b1ca-b3b33c21df1d, abstract = {{In this paper, an inverse source reconstruction method with great potential in radome diagnostics is presented.<br/><br> Defects, e.g., seams in large radomes, and lattice dislocations in frequency selective surface (FSS) radomes, are inevitable, and their electrical effects demand analysis.<br/><br> Here, defects in a frequency selective radome are analyzed with a method based on an integral formulation. Several far-field measurement series, illuminating different parts of the radome wall at 9.35 GHz, are employed to determine the equivalent surface currents and image the disturbances on the radome surface.}}, author = {{Persson, Kristin and Gustafsson, Mats and Kristensson, Gerhard and Widenberg, Björn}}, issn = {{1548-5757}}, keywords = {{radome; frequency selective surface (FSS); source reconstruction; equivalent surface currents; non-destructive testing}}, language = {{eng}}, pages = {{480--483}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, series = {{IEEE Antennas and Wireless Propagation Letters}}, title = {{Source reconstruction by far-field data for imaging of defects in frequency selective radomes}}, url = {{http://dx.doi.org/10.1109/LAWP.2013.2256100}}, doi = {{10.1109/LAWP.2013.2256100}}, volume = {{12}}, year = {{2013}}, }