High-frequency/high-field electron paramagnetic resonance generalized spectroscopic ellipsometry characterization of Cr3+ in β-Ga2O3
(2025) In Applied Physics Letters 126(8).- Abstract
Electron paramagnetic resonance of Cr3+ ions in β -Ga2O3 is investigated using terahertz spectroscopic ellipsometry under magnetic field sweeping, a technique that enables the polarization resolving capabilities of ellipsometry for magnetic resonance measurements. We employed a single-crystal chromium-doped β -Ga2O3 sample, grown by the Czochralski method, and performed ellipsometry measurements at magnetic field strengths ranging from 2 to 8 T, at frequencies from 82 to 125 and 190 to 230 GHz, and at a temperature of 15 K. Analysis of the frequency-field diagrams derived from all Mueller matrix elements allowed us to differentiate between the effects of electron spin Zeeman... (More)
Electron paramagnetic resonance of Cr3+ ions in β -Ga2O3 is investigated using terahertz spectroscopic ellipsometry under magnetic field sweeping, a technique that enables the polarization resolving capabilities of ellipsometry for magnetic resonance measurements. We employed a single-crystal chromium-doped β -Ga2O3 sample, grown by the Czochralski method, and performed ellipsometry measurements at magnetic field strengths ranging from 2 to 8 T, at frequencies from 82 to 125 and 190 to 230 GHz, and at a temperature of 15 K. Analysis of the frequency-field diagrams derived from all Mueller matrix elements allowed us to differentiate between the effects of electron spin Zeeman splitting and zero-field splitting and to accurately determine the anisotropic Zeeman splitting g-tensor and the zero-field splitting parameters. Our results confirm that Cr3+ ions predominantly substitute into octahedral gallium sites. Line shape analysis of Mueller matrix element spectra using the Bloch-Brillouin model provides the spin volume concentration of Cr3+ sites, showing very good agreement with results from chemical analysis by inductively coupled plasma-optical emission spectroscopy and suggesting minimal occupation of sites with inactive electron paramagnetic resonance. This study enhances our understanding of the magnetic and electronic properties of chromium-doped β -Ga2O3 and demonstrates the effectiveness of high-frequency/high-field electron paramagnetic resonance generalized spectroscopic ellipsometry for characterizing defects in ultrawide-bandgap semiconductors.
(Less)
- author
- Rindert, Viktor
LU
; Galazka, Zbigniew ; Schubert, Mathias LU
and Darakchieva, Vanya LU
- organization
- publishing date
- 2025-02-24
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 126
- issue
- 8
- article number
- 082105
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- scopus:85219106397
- ISSN
- 0003-6951
- DOI
- 10.1063/5.0255802
- language
- English
- LU publication?
- yes
- additional info
- Publisher Copyright: © 2025 Author(s).
- id
- e5da1bb7-a079-4968-91ad-2f842b87bc74
- date added to LUP
- 2025-03-17 16:08:02
- date last changed
- 2025-04-04 14:07:00
@article{e5da1bb7-a079-4968-91ad-2f842b87bc74, abstract = {{<p>Electron paramagnetic resonance of Cr<sup>3+</sup> ions in β -Ga<sub>2</sub>O<sub>3</sub> is investigated using terahertz spectroscopic ellipsometry under magnetic field sweeping, a technique that enables the polarization resolving capabilities of ellipsometry for magnetic resonance measurements. We employed a single-crystal chromium-doped β -Ga<sub>2</sub>O<sub>3</sub> sample, grown by the Czochralski method, and performed ellipsometry measurements at magnetic field strengths ranging from 2 to 8 T, at frequencies from 82 to 125 and 190 to 230 GHz, and at a temperature of 15 K. Analysis of the frequency-field diagrams derived from all Mueller matrix elements allowed us to differentiate between the effects of electron spin Zeeman splitting and zero-field splitting and to accurately determine the anisotropic Zeeman splitting g-tensor and the zero-field splitting parameters. Our results confirm that Cr<sup>3+</sup> ions predominantly substitute into octahedral gallium sites. Line shape analysis of Mueller matrix element spectra using the Bloch-Brillouin model provides the spin volume concentration of Cr<sup>3+</sup> sites, showing very good agreement with results from chemical analysis by inductively coupled plasma-optical emission spectroscopy and suggesting minimal occupation of sites with inactive electron paramagnetic resonance. This study enhances our understanding of the magnetic and electronic properties of chromium-doped β -Ga<sub>2</sub>O<sub>3</sub> and demonstrates the effectiveness of high-frequency/high-field electron paramagnetic resonance generalized spectroscopic ellipsometry for characterizing defects in ultrawide-bandgap semiconductors.</p>}}, author = {{Rindert, Viktor and Galazka, Zbigniew and Schubert, Mathias and Darakchieva, Vanya}}, issn = {{0003-6951}}, language = {{eng}}, month = {{02}}, number = {{8}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{High-frequency/high-field electron paramagnetic resonance generalized spectroscopic ellipsometry characterization of Cr<sup>3+</sup> in β-Ga<sub>2</sub>O<sub>3</sub>}}, url = {{http://dx.doi.org/10.1063/5.0255802}}, doi = {{10.1063/5.0255802}}, volume = {{126}}, year = {{2025}}, }