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2021
Mark Scanning Compton X-ray microscopy
Villanueva-Perez, P. ^LU ; Fleckenstein, H. ; Prasciolu, M. ; Murray, K. T. ; Domaracky, M. ; Gregoric, K. ; Mariani, V. ; Gelisio, L. ; Kuhn, M. and Hannappel, J. , et al. (2021) In Optics Letters 46(8). p.1920-1923
- Contribution to journal › Article
2020
Mark Surface optical reflectance combined with x-ray techniques during gas-surface interactions
Albertin, S. ^LU ; Gustafson, J. ^LU ; Zhou, J. ^LU ; Pfaff, S. ^LU ; Shipilin, M. ^LU ; Blomberg, S. ^LU ; Merte, L. R. ^LU ; Gutowski, O. ; Dippel, A. C. and Zetterberg, J. ^LU , et al. (2020) In Journal of Physics D: Applied Physics 53(22).
- Contribution to journal › Article
2019
Mark Combining high-energy X-ray diffraction with Surface Optical Reflectance and Planar Laser Induced Fluorescence for operando catalyst surface characterization
Pfaff, S. ^LU ; Zhou, J. ^LU ; Hejral, U. ^LU ; Gustafson, J. ^LU ; Shipilin, M. ^LU ; Albertin, S. ^LU ; Blomberg, S. ; Gutowski, O. ; Dippel, A. and Lundgren, E. ^LU , et al. (2019) In Review of Scientific Instruments 90(3).
- Contribution to journal › Article

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