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- 2006
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Mark
Growth of ultrathin ZrO2 films on Si(100): Film-thickness-dependent band alignment
(
- Contribution to journal › Article
- 2005
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Mark
UHV-MOCVD growth of TiO2 on SiOx/Si(111): Interfacial properties reflected in the Si 2p photoemission spectra
(
- Contribution to journal › Article