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1995
Mark The vacuum ultraviolet scanning photoelectron microscope at MAX-LAB
Johansson, U. ^LU ; Nyholm, R. ^LU ; Törnevik, C. and Flodström, A. (1995) In Review of Scientific Instruments 66(2). p.1398-1400
- Contribution to journal › Article
1993
Mark Sm- and Yb-induced reconstructions of the Si(111) surface
Wigren, C. ; Andersen, J. N. ^LU ; Nyholm, R. ^LU ; Göthelid, M. ; Hammar, M. ; Törnevik, C. and Karlsson, U. O. (1993) In Physical Review B (Condensed Matter) 48(15). p.11014-11019
- Contribution to journal › Article
1989
Mark Submicrometer-resolution photoelectron-spectroscopy at MAX Lab
Nyholm, R. ^LU ; Eriksson, M. ^LU ; Hansen, K. ^LU ; Sairanen, O. P. ; Werin, S. ^LU ; Flodström, A. ; Törnevik, C. ; Meinander, T. and Sarakontu, M. (1989) In Review of Scientific Instruments 60(7). p.2168-2171
- Contribution to journal › Article