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- 2022
-
Mark
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus
(2022) p.219-228
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2021
-
Mark
System-Level Access to On-Chip Instruments
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graceful Degradation of Reconfigurable Scan Networks
- Contribution to journal › Scientific review
-
Mark
Accessing general IEEE Std. 1687 networks via functional ports
(2021) p.354-363
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Access to on-chip test structures via functional buses
(2021) Nordic Test Forum
- Contribution to conference › Other
- 2020
-
Mark
IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks
(2020) 25th IEEE European Test Symposium (ETS), 2020
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
INTERNET OF THINGS AS A COMPLEMENT TO INCREASE SAFETY
- Contribution to journal › Article
-
Mark
Enabling Image Recognition on Constrained Devices Using Neural Network Pruning and a CycleGAN
(2020) First international workshop on Internet of Things for Emergency Management (IoT4Emergency)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2019
-
Mark
Maintainability of large-scale IoT
(2019) DTU High Tech Summit
- Contribution to conference › Paper, not in proceeding
-
Mark
Functional port for accessing on-chip instruments
(2019) Nordic Test Forum, 2019
- Contribution to conference › Paper, not in proceeding
