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- 2009
-
Mark
On Minimization of Peak Power for Scan Circuit during Test
Tudu, Jaynarayan T. ; Larsson, Erik LU
; Singh, Virendra
and Agrawal, Vishwani
(2009)
European Test Symposium, ETS 2009
p.25-30
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault-tolerant average execution time optimization for general-purpose multi-processor system-on-chips
Vayrynen, M. ; Singh, V. and Larsson, Erik LU
(2009)
Design Automation and Test in Europe (DATE 2009)
p.484-489
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault-Tolerant Average Execution Time Optimization for System-On-Chips
Väyrynen, Mikael ; Singh, Virendra and Larsson, Erik LU
(2009)
Frontiers of High Performance Embedded Computing
- Contribution to conference › Paper, not in proceeding
- 2008
-
Mark
Cycle-Accurate Test Power Modeling and its Application to SoC Test Architecture Design and Scheduling
Samii, Soheil ; Selkälä, Mikko ; Larsson, Erik LU
; Chakrabarty, Krishnendu
and Peng, Zebo
(2008)
In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
27(5).
p.973-977
- Contribution to journal › Article
-
Mark
An Architecture for Integrated Test Data Compression and Abort-on-Fail Testing in a Multi-Site Environment
- Contribution to journal › Article
-
Mark
A reconfigurable power conscious core wrapper and its application to system-on-chip test scheduling
- Contribution to journal › Article
-
Mark
On Reduction of Capture Power for Modular System-on-Chip Test
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Response Compression for Diagnosis in Volume Production
Söderman, Michael and Larsson, Erik LU
(2008)
DAC08 Workshop on Diagnostic Services in Network-on-Chips DSNOC
- Contribution to conference › Paper, not in proceeding
-
Mark
Core-Level Expansion of Compressed Test Patterns
Larsson, Anders ; Zhang, Xin ; Larsson, Erik LU
and Chakrabarty, Krishnendu
(2008)
17th Asian Test Symposium ATS
p.277-277
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
Larsson, Anders ; Larsson, Erik LU
; Chakrabarty, Krishnendu
; Eles, Petru Ion
and Peng, Zebo
(2008)
Design, Automation, and Test in Europe DATE 2008
p.188-193
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding