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        - 2011
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                        Mark
        Level of Confidence Evaluation and Its Usage for Roll-back Recovery with Checkpointing Optimization
    
    
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
 
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                        Mark
        Scheduling Tests for 3D Stacked Chips under Power Constraints
    
    
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
 
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                        Mark
        Test Cost Modeling for 3D Stacked Chips with Through-Silicon Vias
    (2011) Swedish System-on-Chip Conference, SSoCC 2011
- Contribution to conference › Paper, not in proceeding
 
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                        Mark
        Test Scheduling for 3D Stacked ICs under Power Constraints
    (2011) 2nd IEEE International Workshop on Reliability Aware System Design and Test (RASDAT)
- Contribution to conference › Paper, not in proceeding
 
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                        Mark
        Test Planning for 3D Stacked ICs with Through-Silicon Vias
    (2011) Second IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits
- Contribution to conference › Paper, not in proceeding
 
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                        Mark
        SoC-Level Fault Management based on P1687 IJTAG
    (2011)
- Other contribution › Miscellaneous
 
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                        Mark
        Study on the Level of Confidence for Roll-back Recovery with Checkpointing
    (2011) 1st Intl. Workshop on Dependability Issues in Deep-submicron Technologies (DDT 2011)
- Contribution to conference › Paper, not in proceeding
 
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                        Mark
        A Study of Instrument Reuse and Retargeting in P1687
    (2011) IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011)
- Contribution to conference › Paper, not in proceeding
 
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                        Mark
        Design Automation for IEEE P1687
    (2011) Design, Automation and Test in Europe (DATE 2011),
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
 
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                        Mark
        Measurement Point Selection for In-Operation Wear-Out Monitoring
    (2011) 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS11)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
 
 
