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- 2007
-
Mark
Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2006
-
Mark
High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
2006) 14th Philips Research IC Test Seminar(
- Contribution to conference › Paper, not in proceeding
- 2004
-
Mark
An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2001
-
Mark
The Design and Optimization of SOC Test Solutions
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Integrated System-On-Chip Test Framework
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Scheduling and Scan-Chain Division Under Power Constraint
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding