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- 2014
-
Mark
Test Planning and Test Access Mechanism Design for Stacked Chips using ILP
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Planning and Test Access Mechanism Design for 3D SICs
(2014) Swedish System on Chip Conference (SSoCC), 2014
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2013
-
Mark
Test Planning for 3D SICs using ILP
(2013) Swedish System-On-Chip Conference (SSoCC), 2013
- Contribution to conference › Paper, not in proceeding
- 2012
-
Mark
Test Planning for Core-based 3D Stacked ICs under Power Constraints
(2012) IEEE International Workshop on Realiability Aware System Design and Test (RASDAT 2012)
- Contribution to conference › Paper, not in proceeding
- 2011
-
Mark
Scheduling Tests for 3D Stacked Chips under Power Constraints
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Scheduling for 3D Stacked ICs under Power Constraints
(2011) 2nd IEEE International Workshop on Reliability Aware System Design and Test (RASDAT)
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Cost Modeling for 3D Stacked Chips with Through-Silicon Vias
(2011) Swedish System-on-Chip Conference, SSoCC 2011
- Contribution to conference › Paper, not in proceeding
- 2010
-
Mark
Scheduling Tests for Stacked 3D Chips under Power Constraints
(2010) Swedish SoC Conference 2010
- Contribution to conference › Paper, not in proceeding
