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- 2003
-
Mark
Defect Probability-based System-On-Chip Test Scheduling
Larsson, Erik LU
; Pouget, Julien
and Peng, Zebo
(2003)
6th IEEE International Workshop on Design and Diagnostics of Electronics Circuits and Systems DDECS 03,2003
p.25-32
- Contribution to conference › Paper, not in proceeding
-
Mark
System-on-Chip Test Scheduling based on Defect Probability
Larsson, Erik LU
; Pouget, Julien
and Peng, Zebo
(2003)
- Other contribution › Miscellaneous
- 2002
-
Mark
A direct digital RF amplitude modulator
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Integrated Framework for the Design and Optimization of SOC Test Solutions
- Chapter in Book/Report/Conference proceeding › Book chapter
- 2001
-
Mark
The Design and Optimization of SOC Test Solutions
Larsson, Erik LU
; Peng, Zebo
and Carlsson, Gunnar
(2001)
IEEE/ACM International Conference on Computer Aided Design, ICCAD 2001
p.523-530
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Integrated System-On-Chip Test Framework
Larsson, Erik LU
and Peng, Zebo
(2001)
Design, Automation and Test in Europe DATE Conference
p.138-144
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2000
-
Mark
An Integrated System-Level Design for Testability Methodology An Integrated System-Level Design for Testability Methodology
Larsson, Erik LU
(2000)
- Thesis › Doctoral thesis (monograph)
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