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- 2019
-
Mark
Low-Temperature Front-Side BEOL Technology with Circuit Level Multiline Thru-Reflect-Line Kit for III-V MOSFETs on Silicon
Andric, Stefan LU ; Ohlsson, Lars LU
and Wenrersson, Lars Erik
LU
(2019)
92nd ARFTG Microwave Measurement Conference, ARFTG 2019
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding