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- 2023
-
Mark
Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence
Eremchev, Ivan Yu ; Tarasevich, Aleksandr O. ; Kniazeva, Maria A. ; Li, Jun LU
; Naumov, Andrei V.
and Scheblykin, Ivan G.
LU
(2023)
In Nano Letters
- Contribution to journal › Article
- 2005
-
Mark
High order singular rank one perturbations of a positive operator
- Contribution to journal › Article